The professional profile is available at LinkedIn, and the scientific publicaitons list at ResearchGate and here:

Books
1            I.Feranchuk, A.Ivanov, V.-H. Le, A.Ulyanenkov, Non-perturbative description of quantum systems, Heidelberg: Springer, 2015, 362 p.

2            A.Benediktovitch, I.Feranchuk, A.Ulyanenkov, Theoretical Concepts of X-ray Nanoscale Analysis, Heidelberg: Springer, 2013, 318 p.

3            V.G. Baryshevsky, I.D. Feranchuk, A.P. Ulyanenkov, Parametric X-ray radiation in crystals. Theory, Experiments and Applications, Heidelberg: Springer, 2005, 167 p.

 

 

Articles

 

1             S. Vlasenko, A. Benediktovitch, A. Ulyanenkov, V. Uglov, G. Abadias, J. O’Connell, A. Janse van Vuuren, Microstructure characterization of multilayer thin coatings ZrN/Si3N4 by X-ray diffraction using noncoplanar measurement geometry, Physica Status Solidi A: Applications and Materials Science, 2017, accepted

2            O.D.Skoromnik, V.G.Baryshevsky, A.P.Ulyanenkov, I.D.Feranchuk, Radical increase of the parametric X-ray intensity under condition of extremely asymmetric diffraction, Nuclear Inst. and Methods in Physics Research B, 2017, 412, 86-92

3            V. Kaganer, T. Ulyanenkova, A. Benediktovitch, M. Myronov, and A. Ulyanenkov, Bunches of misfit dislocations on the onset of relaxation of Si0.4Ge0.6/Si(001) epitaxial films revealed by high-resolution x-ray diffraction, Journal of Applied Physics, 2017, 50, 776-786

4            I. Lobach, A. Benediktovitch, A. Ulyanenkov, Incorporation of interfacial roughness into recursion matrix formalism of dynamical X-ray diffraction  in multilayers and superlattices, J. Appl. Cryst., 2017, 50, 681-688

5            A. Mikhalychev and A. Ulyanenkov, Bayesian approach to powder phase identification, J. Appl. Cryst., 2017, 50, 776-786

6            A. Mikhalychev, A. Benediktovitch, T. Ulyanenkova, A. Ulyanenkov, Ab initio simulation of diffractometer instrumental function for high-resolution X-ray diffraction, J. Appl. Cryst., 2015, 48, 679-689

7            A. Benediktovitch, A. Zhylik, T. Ulyanenkova, M. Myronov, A. Ulyanenkov, Characterization of dislocations in germanium layers grown on (011)- and (111)-oriented silicon by coplanar and noncoplanar X-ray diffraction, J. Appl. Cryst., 2015, 48, 1-11

8            T. Ulyanenkova, M.Myronov, A.Ulyanenkov, Boron doped cubic silicon probed by high-resolution X-ray diffraction, Phys. Status Solidi C 12 (3), 255–258 (2015)

9            D. Nikolaev, T.A. Lychagina, M. Rusetsky, A. Ulyanenkov, A. Sasaki, Internal optimization of the texture component approximation method, IOP Conference Series Materials Science and Engineering, 82 (1), 1-5 (2015)

10         A. Benediktovitch, T. Ulyanenkova, J. Keckes, A. Ulyanenkov, Sample tilt-free residual stress gradient characterization in TiN coating using in-plane arm lab X-ray diffractometer, J. Appl. Cryst., 2014, 47, 1931-1938

11         A. Benediktovitch, T. Ulyanenkova and A. Ulyanenkov, Resolution function for X-ray powder diffraction in non-coplanar measurement geometry with two degree of freedom detector arm, J. Appl. Cryst., 2014, 47, 1298-1303

12         T.Ulyanenkova, A.Benediktovitch, M.Myronov, J.Halpin, S.Rhead, and A.Ulyanenkov, Stress of homogeneous and graded epitaxial thin films studied by full-shape analysis of high resolution reciprocal space maps, Material Science Forum, 768-769, 249-256, 2014

13         A. Benediktovitch, T. Ulyanenkova, J. Keckes, A. Ulyanenkov, Stress gradient analysis by non-coplanar X-ray diffraction and corresponding refraction correction, Advanced Material Research, 996, 162-168, 2014

14         V. Uglov, V. Skuratov, T. Ulyanenkova, A. Benediktovitch, A. Ulyanenkov, S. Zlotsky, Residual stress state in oxide dispersive steel due to irradiation by swift heavy ions, Advanced Material Research, 996, 22-26, 2014

15         T.Ulyanenkova, M.Myronov, A.Benediktovitch, A.Mikhalychev, J.Halpin and A.Ulyanenkov, Characterization of SiGe thin films using a laboratory X-ray instrument, J. Appl. Cryst., 2013, 46, 898-902

16         A.Zhylik, A.Benediktovitch, I.Feranchuk, K.Inaba, A.Mikhalychev and A.Ulyanenkov, Covariant description of X-ray diffraction from anisotropically relaxed epitaxial structures, J. Appl. Cryst., 2013, 46, 919-925

17         A.Zhylik, A.Benediktovich, A.Ulyanenkov, H.Guerault, M.Myronov, A.Dobbie, D.R.Leadley, T.Ulyanenkova, High-resolution X-ray diffraction investigation of relaxation and dislocations in SiGe layers grown on (001), (011), and (111) Si substrates, J. of Applied Physics, 123714, 109  (2011)

18         A.Benediktovich, H.Guerault, I.Feranchuk, V.Uglov, A.Ulyanenkov, Influence of surface roughness on evaluation of stress gradients in coatings,  Materials Science Forum, 121,  681 (2011)

19         A.Benediktovich, I.Feranchuk, A.Ulyanenkov, Calculation of X-ray stress factors using vector parameterization and irreducible representations for SO(3) group, Materials Science Forum, 387, 681 (2011)

20         A. Zhylik, F. Rinaldi, M. Myronov, K. Saito, S. Menzel, A. Dobbie, D. R. Leadley, T. Ulyanenkova, I. D. Feranchuk, and A. Ulyanenkov, High-resolution reciprocal space mapping of distributed Bragg reflectors and virtual substrates, Phys. Status Solidi A 208 (11), 2582–2586 (2011)

21         A. Ulyanenkov, J. Chrost, P. Siffalovic, L. Chitu, E. Majkova, K. Erlacher, H. Guerault, G. Maier, M. Cornejo, B. Ziberi, and F. Frost, GISAXS and AFM study of self-assembled Fe2O3 nanoparticles and Si nanodots, Phys. Status Solidi A 208 (11), 2619–2622 (2011)

22         A. Benediktovitch, F. Rinaldi, S. Menzel, K. Saito, T. Ulyanenkova, T. Baumbach, I. D. Feranchuk, and A. Ulyanenkov, Lattice tilt, concentration, and relaxation degree of partly relaxed InGaAs/GaAs structures, Phys. Status Solidi A 208 (11), 2539–2543 (2011)

23         A.Benediktovich, A.Ulyanenkov, F.Rinaldi, K.Saito, V.M.Kaganer, Concentration and relaxation depth profiles of InxGa1−xAs/GaAs and GaAs1−xPx/GaAs graded epitaxial films studied by x-ray diffraction, Phys. Rev. B, 035302, 84 (2011)

24         A. I. Benediktovich, I. D. Feranchuk, and A. Ulyanenkov, X-ray dynamical diffraction from partly relaxed epitaxial structures, Phys. Rev. B, 235315, 80  (2009)

25         Коршунов Ф. П., Алексеева Т. А., Злоцкий С. В., Лазарь А. П., Углов В. В., Ульяненков А. П, Неразрушающий анализ GIXRD методом градиентных остаточных напряжений в поликристаллических покрытиях, Доклады Национальной Академии Наук Беларуси,52  (3), 2008, 41-47

26         P. Colombi, D. K. Agnihotri, V. E. Asadchikov, E. Bontempi, D. K. Bowen, C. H. Chang, L. E. Depero, M. Farnworth, T. Fujimoto, A. Gibaud, M. Jergel, M. Krumrey, T. A. Lafford, A. Lamperti, T. Ma, R. J. Matyi, M. Meduna, S. Milita, K. Sakurai, L. Shabelnikov, A. Ulyanenkov, A. Van der Lee and C. Wiemer, Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment, J. Appl. Cryst. (2008) 41, 143–152

27         T. A. Alexeeva, A. I. Benediktovich, I. D. Feranchuk, T. Baumbach, and A. Ulyanenkov, Long-range scans and many-beam effects for high-resolution X-ray diffraction from multilayered structures: Experiment and theory,  Phys. Rev. B, 174114,  77 (2008)

28         V.V. Uglov, V.M. Anishchik, S.V. Zlotski, I.D. Feranchuk, T.A. Alexeeva, A. Ulyanenkov, J. Brechbuehl, A.P. Lazar, Composition and phase stability upon annealing of gradient nitride coatings, Surface & Coatings Technology 202 (2008) 2389–2393

29         V.G. Baryshevsky, K.G. Batrakov, I.D. Feranchuk, A.A. Gurinovich, A.O. Grubich, A.S. Lobko, A.A. Rouba, B.A. Tarnopolsky, P.F. Safronov, V.I. Stolyarsky, A.P. Ulyanenkov, Experimental observation of frequency tuning of X-ray radiation from nonrelativistic electrons in crystals, Physics Letters A363 (2007) 448-452

30         V.G. Baryshevsky, K.G. Batrakov, I.D. Feranchuk, A.A. Gurinovich, A.O. Grubich, A.S. Lobko, A.A. Rouba, B.A. Tarnopolsky, P.F. Safronov, V.I. Stolyarsky, A.P. Ulyanenkov, Experimental observation of frequency tuning of X-ray radiation from nonrelativistic electrons with a silicon crystal, X-ray Spectrometry 36 (2007) 343-347

31          I. D. Feranchuk, S. I. Feranchuk, and A. P. Ulyanenkov, Self-consistent approach to x-ray reflection from rough surfaces, Phys.Rev.B 75 (2007) 085414

32         T. A. Alexeeva, V. V. Uglov, V. M. Anishchik, S. V. Zlotski, J. Brechbühl, H. Guerault, A. Lazar, A. Ulyanenkov, and T. Baumbach, Stress And Composition Evaluation For Gradient Nitride Coatings, Advances in X-ray Analysis (Powder Diffraction), 52 (2007) 1-7

33         B.He, A.Ulyanenkov, Residual Stress Analysis With Multiple HKL Rings Collected By Area Detectors, Advances in X-ray Analysis (Powder Diffraction), 52 (2007) 187-192

34         A. Ulyanenkov, Universal software for residual stress evaluation from 1D and 2D x-ray diffraction data, Powder Diffraction 22(2) (2007) 186  

35         A. Ulyanenkov, Novel methods and universal software for HRXRD, XRR and GISAXS data interpretation, Applied Surface Science, 2006, 253 (1), 106-111.

36         A. Ulyanenkov, LEPTOS User Manual, Karlsruhe: Bruker AXS GmbH, 2006, 297 p.

37         В.Г.Барышевский, К.Г. Батраков, А.О. Грубич, А.А. Гуринович, А.С. Лобко, А.А. Ровба, П.Ф. Сафронов, В.И. Столярский, Б.А. Тарнопольский, А.П. Ульяненков, И.Д. Феранчук, Когерентное тормозное и параметрическое рентгеновское излучение от нерелятивистских электронов в кристалле, Письма в ЖЭТФ, 2006, 32, 50-56.

38         V. G. Baryshevsky, K. G. Batrakov, I. D. Feranchuk, A. O. Grubich, A. A. Gurinovich*, A. S. Lobko, A. A. Rouba, P. F. Safronov, V. I. Stolyarsky, B. A. Tarnopolsky, and A. P. Ulyanenkov, Coherent Bremsstrahlung and Parametric X-ray Radiation from Nonrelativistic Electrons in a Crystal, Technical Physics Letters, 2006, 32 (5), pp. 392–395

39         K.Saito, A.Ulyanenkov, V.Grossmann, H.Ress, L.Bruegemann, H.Ohta, T.Kurosawa, S.Ueki and H.Funakubo, Structural Characterization of BiFeO3 Thin Films by Reciprocal Space Mapping, Japanese Journal of Applied Physics, 45 (9B), 2006,  7311-7314

40         A. Ulyanenkov, S. Sobolewski, Extended genetic algorithm: Application to X-ray analysis, J. of Physics D: Appl.Phys., 2005, 38, 235-238.

41         I. Feranchuk, O. Lugovskaya, A. Ulyanenkov, Dynamical diffraction theory for the parametric X-rays and coherent bremsstrahlung, Nucl.Instrum and Meth. B, 2005, 234, 148-158.

42         I.D. Feranchuk, A. Ulyanenkov, Anomalous scattering method in crystallography on the basis of the parametric X-ray radiation, Acta Cryst.A.,  2005, 61, 125-133.

43         V.G. Baryshevsky, K.G. Batrakov, I.D. Feranchuk, A.A. Gurinovich, A.O. Grubich, A.S. Lobko, A.A. Rouba, B.A. Tarnopolsky, P.F. Safronov, V.I. Stolyarsky, A.P. Ulyanenkov, Experiments with Parametric X-Ray Radiation (PXR) from Non-Relativistic Electrons, arXiv:physics/0507036 [physics.ins-det], 2005.

44         A. Ulyanenkov, LEPTOS: Software for interpretation of X-ray reflectivity and X-ray diffraction data from multilayers and superlattices, Proc.of SPIE, 2004, 5536, 1-15.

45         A. Ulyanenkov, R. Eisenhower, I. Feranchuk, H. Guerault, H. Ress, Ultra-fast simultaneous fitting of several Bragg reflections from AlAs/GaAs superlattices using method of eigenwaves, Powder Diffraction, 2004, 19 (2), 195-196.

46         A. Ulyanenkov, R. Eisenhower, H. Guerault, H. Ress, Simultaneous fitting of several Bragg reflections, Global Semiconductor, 2004, 7, 28-29.

47         I.D. Feranchuk, A.Ulyanenkov, Realization of the anomalous scattering method in crystallography on the basis of the parametric X-ray radiation, arXiv:cond-mat/0312310 [cond-mat.mtrl-sci], 2003

48         I.D. Feranchuk, S.I. Feranchuk, L.I. Komarov, S.I. Sytova, A.P. Ulyanenkov, Analytical ansatz for self-consistent calculations of X-ray transmission and reflection coefficients at graded interfaces, Phys. Rev. B, 2003, 67, 235417-235429.

49         I. D. Feranchuk, S. I. Feranchuk, A. A. Minkevich, and A. Ulyanenkov,  Description of X-ray reflection and diffraction from periodical multilayers and superlattices by the eigenwave method, Phys. Rev. B, 235307 68 (2003)

50         I.D. Feranchuk, A.A. Minkevich,  A.P. Ulyanenkov, About non-Gaussian behaviour of the Debye-Waller factor at large scattering vectors, Europ. Phys. Journ.: Applied Physics, 2003, 24, 21-26.

51         I.D. Feranchuk, L.I. Gurskii, L.I. Komarov, O.M. Lugovskaya, F. Burgazy, A. Ulyanenkov, A new method for calculation of crystal susceptibilities for X-ray diffraction at arbitrary wavelength, Acta Cryst. A, 2002, 58, 370-384.

52         I.D. Feranchuk, L.I. Komarov, A.P. Ulyanenkov, Control of the atom (nucleus) lifetime in the excited state by means of a low-frequency external field, J.Phys.B: At.Mol.Opt.Phys., 2002, 35, 3957-3965.

53         I.D. Feranchuk, A.A. Minkevich, A.P. Ulyanenkov, Estimation of the Debye temperature for crystals with polyatomic unit cell, Europ. Phys. Journ.: Applied Physics, 2002, 19, 95-101.

54         I.D. Feranchuk, A.P. Ulyanenkov, Transition radiation from electrons: Application to thin film and superlattice analysis, Phys. Rev. B, 2001, 63, 155318.

55         A. Ulyanenkov, K. Inaba,     P. Mikulik, N. Darowski, K. Omote, U. Pietsch, J. Grenzer, A. Forchel, X-ray diffraction and reflectivity analysis of GaAs/GaInAs free-standing trapezoidal quantum wires, J.Phys.D: Appl.Phys., 2001, 342, A179-A185.

56         I.D. Feranchuk, A. Ulyanenkov, Interference of parametric x-ray and coherent bremsstrahlung radiation from nonrelativistic electrons: application to the phase analysis in crystallography, Acta Crystal. A, 2001, 57, 283-289.

57         I.D. Feranchuk, A. Ulyanenkov, J. Harada, J.C.H. Spence, Parametric x-ray radiation and coherent bremsstrahlung from nonrelativistic electrons in crystals, Phys. Rev. E, 2000, 62, 4225-4234.

58         K. Omote, J. Harada, A. Ulyanenkov, T.C. Huang, Characterization of surfaces and thin films using a Rigaku  grazing-incidence diffractometer, Nuclear Science Journal of Malaysia, 2000, 18, 170-184.

59         U. Pietsch,  N. Darowski,  J. Grenzer, A. Ulyanenkov, K.H. Wang, A. Forchel, Interpreting of photoluminescence data from lateral  nanostructures on the basis of internal strain distribution, Physica B, 2000, 283, 92-96.

60         A. Ulyanenkov, R. Matsuo, K. Omote, K. Inaba, J. Harada, M. Ishino, M.Nishii, O.Yoda, X-ray scattering study of interfacial roughness correlation in Mo/Si multilayers fabricated by ion beam sputtering, J.Appl.Phys., 2000, 87, 7255-7260.

61         A. Ulyanenkov, K. Omote, J. Harada, The genetic algorithm: refinement of X-ray reflectivity data from multilayers and thin films, Physica B, 2000, 283, 237-241.

62         A. Ulyanenkov, K. Omote, J. Harada, The evaluation of structure parameters of a Mo/Si superlattice using x-ray scattering data and a genetic algorithm, Advances in X-ray Analysis (Powder Diffraction), 2000, 43, 53-64.

63         I.D. Feranchuk, A.P. Ulyanenkov About new applications of the parametric X-ray radiation for crystallography, Acta Crystal. A, 1999, 55, 466-470.

64         A. Ulyanenkov, T. Baumbach, N. Darowski, U. Pietsch, K.H. Wang, A. Forchel, T. Wiebach, Investigation of in-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001], J.Appl.Phys., 1999, 85, 1524-1530.

65         A. Ulyanenkov,  N. Darowski,  J. Grenzer, U. Pietsch, K.H. Wang, A. Forchel, Evaluation of strain distribution in freestanding and buried lateral nanostructures, Phys.Rev. B, 1999, 60, 16701-16714.

66         A. Ulyanenkov, K. Omote, R. Matsuo, J. Harada, S.-Y. Matsuno, Specular and nonspecular x-ray scattering study of SiO2/Si structures, J.Phys.D: Appl.Phys., 1999, 32, 1313-1318.

67         A. Ulyanenkov, A. Takase, M. Kuribayashi, K. Ishida, A. Ohtake, K. Arai, T. Hanada, T. Yasuda, T. Yao, H. Tomita, S. Komiya, X-ray reflectivity from ZnSe/GaAs heterostructures, J.Appl.Phys., 1999, 85, 1520-1523.

68         A. Ulyanenkov, Grazing-incidence x-ray diffraction from multilayers, taking into account diffuse scattering from rough interfaces, Appl.Phys. A, 1998, 66, 193-199.

69         A. Ulyanenkov, U. Klemradt, U.Pietsch, Investigation of strain relaxation in GaInAs/GaAs superlattices by x-ray diffuse scattering, Physica B, 1998, 248, 25-30.

70         С.А. Степанов, А.Я. Силенко, А.П. Ульяненков, И.Я. Дубовская, Многоволновое параметрическое рентгеновское излучение частиц в кристаллах, Поверхность: Физика, химия, механика, 1997, 8, 61-64.

71         I.D. Feranchuk, L.I. Komarov, A.P. Ulyanenkov, Two-level system in a one-mode quantum field: numerical solution on the basis of the operator method, J.Phys.A: Math. Gen., 1996, 29, 4035-4047.

72         S.A. Stepanov, A.Ya. Silenko, A.P. Ulyanenkov, I.Ya. Dubovskaya, Multi-wave parametric X-ray production by relativistic particles in crystals: comparison of computations and experimental results, Nuclear Instrum. Methods. B, 1996, 117, 55-67.

73         I.D. Feranchuk, L.I. Komarov, I.V. Nichipor, A.P. Ulyanenkov, Operator method in the problem of quantum anharmonic oscillator, Ann. Phys. N.Y., 1995, 238, 370-440.

74         A.P. Ulyanenkov, S.A. Stepanov, U. Pietsch, R. Kohler, A dynamical diffraction approach to grazing-incidence X-ray diffraction by multilayers with lateral lattice misfits, J.Phys. D: App. Phys., 1995, 28, 2522-2529.

75         I.D. Feranchuk, I.V. Nichipor, A.P. Ulyanenkov, Program complex for the description of electromagnetic processes during planar and axial channeling of relativistic particles, Nucl. Instr. and Methods in Phys. Research B., 1994, 88, 369-381.

76         S.A. Stepanov, A.P. Ulyanenkov, A new algorithm for computation of X-ray multiple Bragg diffraction, Acta Crystallographica A, 1994, 50, 579-585.

77         I.Ya. Dubovskaya, S.A. Stepanov, A.Ya. Silenko, A.P. Ulyanenkov, Computation of parametric X-ray production by relativistic particles in crystals under multiple Bragg diffraction, J. Phys. C: Condens.Matter, 1993, 5, 7771-7784.

78         И.В. Ничипор, А.П. Ульяненков, И.Д. Феранчук, Решение уравнения Шредингера для квантовых систем в периодических полях, Вестник БГУ. Сер. 1. Математика. Физика. Информатика, 1991, 3,  47-52.

79         I.D. Feranchuk, A.P. Ulyanenkov, V.S. Kuz'min, Specific heat from an unsymmetrical double well potential, Chem. Phys., 1991, 157, 61-66.

80         В.С. Кузьмин, А.П. Сайко, А.П. Ульяненков, Фазовый переход порядок-порядок в обощенной модели Дике с учетом адиабатического электрон-фононного взаимодействия, Теоретическая и математическая физика, 1989, 80, №3, 453-438.

 

Patents:

 

1            Method of fast simulation and fitting of X–ray spectra from superlattices: European Patent EP1469302 A1 / I. Feranchuk, A. Ulyanenkov; applicant Bruker AXS GmbH. --- EP20030008687 20030416; appl. 16.04.03; published 20.10.04 // European Patent Office.

2            X-ray generating method and device: Japan Patent P2000-30892 / J. Harada, S. Hayashi, K. Omote, V.G. Baryshevski, I.D. Feranchuk, A.P. Ulyanenkov; applicant RIGAKU CORP --- 10-192182; appl. 07.07.98; published 28.01.00 // Japanese Patent Office.

3            A method for characterization about the uniformity of density in thin films, and its apparatus and system: Japan Patent P2001-349849A / K. Omote, A. Ulyanenkov, S. Kawamura; applicant RIGAKU CORP --- N WO 01/75426; appl. 04.04.00; published 30.03.01 //  Japanese Patent Office.

4            Analyzing method for non-uniform-density sample and device and system thereof: patent US 20030157559 A1 / K. Omote, A. Ulyanenkov, S. Kawamura; appl. WENDEROTH, LIND & PONACK, L.L.P. --- N 2001-088656; appl. 30.03.01; published 21.08.03 // United States Patent Office.

5            A method for material structure analysis and its apparatus: Japan Patent P2001-83106 / A.P. Ulyanenkov, J. Harada; applicant RIGAKU CORP --- N 2001-83106; appl. 10.09.99; published 30.03.01 // Japanese Patent Office.

6            Method of determining parameters of a sample by X-ray scattering applying an extended genetic algorithm with truncated use of the mutation operator: US Patent Application 20050074097 / A.Ulyanenkov, S.Sobolevski; applicant Bruker AXS GmbH. --- 20050074097; appl. 30.09.04; published 07.04.05 // United States Patent Office.

7            Method of determining parameters of a sample by X-ray scattering applying an extended genetic algorithm including a movement operator: US Patent 7,110,492 / A. Ulyanenkov, S. Sobolevski; applicant Bruker AXS GmbH. --- N 10/952,800; appl. 30.09.04; published 19.09.06 // United States Patent Office.

8            Determining parameters of a sample by X–ray scattering applying a genetic algorithm with integrated gradient method: European Patent EP1522959 A1 / A. Ulyanenkov, S. Sobolevski; applicant Bruker AXS GmbH. --- N 03022421.6; appl. 07.10.03; published 13.04.05 // European Patent Office.

9            Determining parameters of a sample by X–ray scattering applying an extended genetic algorithm with truncated use of the mutation operator: European Patent EP1522958 A1 / A. Ulyanenkov, S. Sobolevski; applicant Bruker AXS GmbH. --- N 03022420.8; appl. 07.10.03; published 13.04.05 // European Patent Office.

10        X-ray diffraction method for residual stress gradient determination using in-plane diffractometer arm: European Patent application EP14166206.4 / A.Benediktovitch, T.Ulyanenkova, A.Ulyanenkov; applicant Rigaku Europe SE // European Patent Office

 

Conferences:

 

1            A. Ulyanenkov, S.Vlasenko, V.Uglov, G. Abadias, A.Benediktovitch, J. O’Connell, A. J. van Vuuren, Study of multilayer microstructure by XRD using noncoplanar measurement geometry, 24th Congress and General Assembly of the International Union of Crystallography, 21-28 August 2017, Hyderabad, India

2            A. Mikhalychev, A. Benediktovitch, A. Ulyanenkov, Simulation of resolution effects in HRXRD by semi-analytical ray-tracing, 4-8th September, 2016, Brno, Czech Republic

3            I. Lobach, A. Benediktovitch, A. Ulyanenkov, Incorporation of interfacial roughness to recursion matrix formalism of dynamical x-ray diffraction in multilayers and superlattices, 4-8th September, 2016, Brno, Czech Republic

4            A. Benediktovitch, T.Ulyanenkova, A. Mikhalychev, V.M. Kaganer, M. Myronov, A. Ulyanenkov, Misfit dislocation density determination at relaxation onset: reciprocal space map analysis of thin SiGe/Si layers, 4-8th September, 2016, Brno, Czech Republic

5            A. Mikhalychev, A. Ulyanenkov, Bayesian approach to phase identification from powder diffraction data, 15th EPDIC conference, 12-15 June 2016, Bari, Italy

6            A. Benediktovitch, A. Mikhalychev, T. Ulyanenkova, M. Myronov, V.M. Kaganer, A. Ulyanenkov, X-ray diffraction analysis of misfit dislocations if SiGe/Si thin layers: the role of finite thickness on dislocation induced peak shape, 15th EPDIC conference, 12-15 June 2016, Bari, Italy

7            A.Ulyanenkov, A.Benediktovitch, T.Ulyanenkova, J.Keckes, Analysis of residual stress gradients by X-ray diffraction with five-axis diffractometer, 12th International Conference on the Mechanical Behavior of Materials, 10-14 May, 2015, Karlsruhe, Germany

8            A.Ulyanenkov, A.Benediktovitch, T.Ulyanenkova, J.Keckes, Analysis of residual stress gradients by X-ray diffraction with five-axis diffractometer, Size-Strain conference, 21-24 September, 2015, Oxford, United Kingdom

9            D. Nikolayev, T. Lychagina, M. Rusetsky, A. Ulyanenkov, A. Sasaki, Internal optimization of the texture component approximation method, 17th International Conference on Textures of Materials, August 24 – 29, 2014, Dresden, Germany

10         M. Rusetsky, A. Ulyanenkov, D. Nikolayev, T. Lychagina, New software for quantitative texture analysis, 17th International Conference on Textures of Materials, August 24 – 29, 2014, Dresden, Germany

11         A.Zhylik, A.Benediktovitch, I.Feranchuk, T.Ulyanenkova, A.Ulyanenkov, Accessible reciprocal space and resolution element of vertical goniometer with extra axis for non-coplanar diffraction, 12th Conference on High-Resolution X-Ray Diffraction and Imaging, 14-19 September, 2014, Grenoble, France

12         A.Benediktovitch, A.Zhylik, T.Ulyanenkova, M.Myronov, A.Ulyanenkov, Characterization of dislocations in germanium layers grown on (011) and (111) oriented silicon by coplanar and non-coplanar X-ray diffraction, 12th Conference on High-Resolution X-Ray Diffraction and Imaging, 14-19 September, 2014, Grenoble, France

13         A.Mikhalychev, A.Benediktovitch, T.Ulyanenkova, A.Ulyanenkov, Ab initio simulation of diffractometer instrumental function for HRXRD, 12th Conference on High-Resolution X-Ray Diffraction and Imaging, 14-19 September, 2014, Grenoble, France

14         A.Benediktovitch, T.Ulyanenkova, J.Keckes, A.Ulyanenkov, Residual stress gradient measurement by diffractometer equipped with in-plane arm, 9th European Conference on Residual Stresses, 7-10 July 2014, Troyes, France

15         V.Uglov, V.Skuratov, T.Ulyanenkova, A.Benediktovitch, Janse van Vuuren, J.Neethling, A.Ulyanenkov, Residual stress state in oxide dispersive steel due to irradiation by swift heavy ions, 9th European Conference on Residual Stresses, 7-10 July 2014, Troyes, France

16         K.Saito, R.Yokoyama, K.Inaba, R.Yasukawa, A.Ulyanenkov, XRD Solution on Stress Analysis from Rigaku, Herbstsitzung des FA Eigenspannungen, 12–13 November 2013, Ettlingen, Germany

17         Benediktovitch, T. Ulyanenkova, J. Keckes, A. Ulyanenkov, Residual Stress Gradient Measurement by Diffractometer Equipped with In-plane Arm, Herbstsitzung des FA Eigenspannungen, 12–13 November 2013, Ettlingen, Germany

18         A.Benediktovitch, A.Ulyanenkov, Modification of line profile analysis methods for thin film materials study, Denver X-ray Conference, 6-10 August 2012, Denver, CO, USA

19         A.Benediktovitch, A.Ulyanenkov, Strain and composition depth profile in graded epitaxial thin films studied by high resolution reciprocal space mapping, The 9th International Conference on Residual Stresses, October 7-9, 2012. Garmisch-Partenkirchen, Germany

20         A.Zhylik, A.Benediktovich, I.D.Feranchuk, K.Inaba, A.Mikhalychev, A.Ulyanenkov, Invariant parameters for description of X-ray diffraction from anisotropically relaxed epitaxial structures, 11th Biennial Conference on High Resolution X-Ray Diffraction and Imaging, September 15-20, 2012, Saint-Petersburg, Russia

21         A.Benediktovitch, I.Feranchuk, A.Ulyanenkov, Theory of high resolution X-ray diffraction in nonperfect crystals: statistical dynamical theory beyond the framework of Takagi-Taupin approximation, 11th Biennial Conference on High Resolution X-Ray Diffraction and Imaging, September 15-20, 2012, Saint-Petersburg, Russia

22         T.A.Ulyanenkova, K.Saito, M.Myronov, A.P.Ulyanenkov, Characterization of SiGe thin films by lab-type X-ray instrument, 11th Biennial Conference on High Resolution X-Ray Diffraction and Imaging, September 15-20, 2012, Saint-Petersburg, Russia

23         A.Ulyanenkov, A.Benediktovitch, A.Zhilik, T.Ulyanenkova, I.Feranchuk, K.Saito, Coherent and incoherent X-ray scattering from partly relaxed semiconductor structures possessing dislocations, Denver X-ray Conference, 1-5 August 2011, Colorado Springs, CO, USA

24         A.Benediktovitch, A.Ulyanenkov, A.Zhilik, T.Ulyanenkova, I.Feranchuk, K.Saito, M.Myronov, X-ray diffraction analysis of strain and composition profiles of graded epitaxial films, Size-Strain VI, 17-20 October 2011, Hyeres, France

25         H.Morioka, K.Saito, F.Rinaldi, S.Menzel, I.Feranchuk, A.Zhilik, A.Benediktovich, A.Ulyanenkov, Stress relaxation in epitaxial thin films revealed by simulation of X-ray diffraction reciprocal space maps, International Symposium on Compound Semiconductors, May 31 – June 4, 2010, Kagawa, Japan

26         A.Ulyanenkov, I.Feranchuk, A.Benediktovich, A.Zhilik, V.Uglov, H.Guerault, Accounting of surface roughness in evaluation of stress gradients in coatings, Früjahrssitzung des Fachausschusses Eigenspannungen, 3-4 May, 2010, DESY, Hamburg, Germany

27         A.  Ulyanenkov,  J.Chrost, P.Siffalovic, L.Chitu, E.Majkova, K. Erlacher, G. Maier, M. Cornejo, B. Ziberi and F. Frost, GISAXS study of FeO and Si nanoparticles, 7th LEPTOS User Meeting, 19-21 July  2010, Minsk, Belarus

28         A.Ulyanenkov , A. Lazar, H.Guerault, Combined residual stress and texture evaluation of TixCr1-xN coatings, 7th LEPTOS User Meeting, 19-21 July  2010, Minsk, Belarus

29         A.Ulyanenkov, F.Rinaldi, S.Menzel, A.Benediktovitch, K.Saito, A.Zhilik, I.Feranchuk, High-resolution reciprocal space mapping of InGaAs/GaAs structures: from pseudomorphic to fully relaxed state, Denver X-ray Conference, 2-6 August 2010, Denver, CO, USA

30         A.Ulyanenkov, A.Benediktovitch, A.Zhilik, T.Ulyanenkova, I.Feranchuk, Calculation of X-ray stress factors on the basis of SO(3) vector parameterization, Denver X-ray Conference, 2-6 August 2010, Denver, CO, USA

31         A.Benediktovich, I.Feranchuk, A.Ulyanenkov, Calculation of X-ray stress factors using vector parameterization and irreducible representations for SO(3) group, 8th European Conference on Residual Stress, 26-28 June 2010, Riva del Garda, Italy

32         A.Ulyanenkov, I. Feranchuk, V.Uglov, H.Guerault, Influence of surface roughness on evaluation of stress gradients in coatings, 8th European Conference on Residual Stress, 26-28 June 2010, Riva del Garda, Italy

33         A.Ulyanenkov, M.Myronov, A.Dobbie, D.R.Leadley, H.Guerault, A.Benediktovitch, A.Zhilik, T.Ulyanenkova, K.Shcherbachev, High-Resolution X-ray Reciprocal Space Mapping of High Ge Content Graded SiGe Buffers Grown on Non-Standard Orientation Si Substrates, The 16th  International Conference on Crystal Growth, 8-13 August 2010, Beijing, China

34         R. Arnhold, A. Herold, A.Ulyanenkov, D2 CRYSO Orientation Mapping on Single Crystals, The 16th  International Conference on Crystal Growth, 8-13 August 2010, Beijing, China

35         A.Ulyanenkov, F.Rinaldi, S.Menzel, A.Zhilik, A.Benediktovitch, K.Saito, Consistent Evaluation of the Crystallographic Miscut, Concentration and Relaxation Degree in InGaAs/GaAs Structures by High-Resolution Reciprocal Space Mapping, The 16th  International Conference on Crystal Growth, 8-13 August 2010, Beijing, China

36         A.Ulyanenkov, J.Chrost, P.Siffalovic, L.Chitu, E.Majkova, K. Erlacher, G.Maier, M. Cornejo, B.Ziberi and F. Frost, GISAXS and AFM study of self-assembled FeO and Si nanoparticles, 10th Conference on High-Resolution X-ray Diffraction and Imaging, 20-23 September 2010, Warwick, UK

37         I.D.Feranchuk, F.Rinaldi, S.Menzel, M.Myronov, A.Dobbie, D.R.Leadley, A.Zhilik, K.Saito, and A. Ulyanenkov, High-resolution reciprocal space mapping of multilayers with concentration and relaxation gradients, 10th Conference on High-Resolution X-ray Diffraction and Imaging, 20-23 September 2010, Warwick, UK

38         F.Rinaldi, S.Menzel, I.D.Feranchuk, A.Zhilik, K. Saito, T.Ulyanenkova and A. Ulyanenkov, HRXRD analysis of MBE grown complex superlattices, 10th Conference on High-Resolution X-ray Diffraction and Imaging, 20-23 September 2010, Warwick, UK

39         A.Zhilik, M.Myronov, A.Dobbie, D.R.Leadley, H.Guerault, T.Ulyanenkova, A.Benediktovitch, A.Ulyanenkov, Reciprocal space mapping of graded SiGe buffers grown on non-standard orientation Si substrates, 10th Conference on High-Resolution X-ray Diffraction and Imaging, 20-23 September 2010, Warwick, UK

40         A.Benediktovich, F.Rinaldi, S.Menzel, K.Saito, T.Ulyanenkova, I.Feranchuk, A.Ulyanenkov, Lattice tilt, concentration and relaxation degree of partly relaxed InGaAs/GaAs structures, 10th Conference on High-Resolution X-ray Diffraction and Imaging, 20-23 September 2010, Warwick, UK

41         A.Ulyanenkov and P.Schoderboeck, Stress gradient in molybdenum coatings, Herbstsitzung des Fachausschusses Eigenspannungen, 26-27 Oktober, 2010, BESSY, Berlin, Germany

42         A.Benediktovitch, I.Feranchuk and A.Ulyanenkov, Dynamical theory of X-ray diffraction from the partially relaxed layers, E-MRS 2009 Spring Meeting, Strasbourg, France

43         A.Benediktovitch, I.Feranchuk and A.Ulyanenkov, Dynamical X-ray scattering from the relaxed structures, International Conference on Neutron and X-ray Scattering, 29 June – 3 July 2009, Kuala-Lumpur, Malaysia

44         A.Ulyanenkov, A.Benediktovitch, I.Feranchuk, B.He and H.Ress, High-resolution X-ray diffraction data analysis from the partly relaxed semiconductor structures, Denver X-ray Conference, 27-31 July 2009, Colorado Springs, CO, USA

45         A.Ulyanenkov, K.Erlacher, H.Guerault, A.Fuss, P.Siffalovic, L.Chitu, E.Majkova, G.Maier X-ray and AFM study of self-assembled FeO nanoparticles, XIV International Conference on Small-Angle Scattering 13- 18 September,  2009, Oxford, UK

46         A.Uyanenkov, A.Lazar, H.Guérault, Combined residual stress and texture evaluation in TixCr1-xN coatings, 5th International Conference on Mechanical Stress Evaluation by Neutrons and Synchrotron Radiation, 10-12 November 2009, Mito, Japan

47         T.A.Ulyanenkova, A.I.Benediktovich, I.Feranchuk, T.Baumbach, A.Ulyanenkov, Long-range scans and many-beam effects for high-resolution x-ray diffraction from multilayered structures, 57th Denver X-ray Conference: p. 80, 4-8 August 2008, Denver, USA.

48         A.Ulyanenkov, V.V.Uglov, T.A.Ulyanenkova, A.Lazar, H.Guérault, V.M.Anishchik, S.V.Zlotski, T.Baumbach, Stress gradients in TixCr1-xN coatings, 57th Denver X-ray Conference: p. 117, 4-8 August 2008, Denver, USA

49         I. D. Feranchuk, T. Ulyanenkova, A. I. Benediktovich, A. Ulyanenkov, T.Baumbach, Many-beam effects in wide-angle dynamical X­ray diffraction from multilayers, XTOP Conference, p.145, 15-19 September 2008, Linz, Austria

50         A. Ulyanenkov, V. V. Uglov, T. Ulyanenkova, A. Lazar, H. Guérault, V.M. Anishchik, S. V. Zlotski, T. Baumbach, Strain and stress gradients in thin film coatings, XTOP Conference, p. 55, 15-19 September 2008, Linz, Austria

51         A.Ulyanenkov, V.V.Uglov, V.M.Anishchik, S.V.Zlotski, J.Brechbühl, A.Lazar, T.A.Alexeeva, Stress and composition evaluation for gradient nitride coatings, 56th Denver X-ray Conference: p. 35, 30 July - 3 August 2007, Colorado Springs, USA

52         A.Ulyanenkov, Universal software for residual stress evaluation from 1D and 2D x-ray diffraction data, 56th Denver X-ray Conference: p. 46, 30 July - 3 August 2007, Colorado Springs, USA.

53         V.V.Uglov, V.M.Anishchik, S.V.Zlotski, I.D.Feranchuk, T.A.Alexeeva,  A.Ulyanenkov, J.Brechbuehl, A.P.Lazar, Evolution of composition and hardness of gradient nitride coatings E-MRS, p.87, May 28 - June 1, 2007, Strasbourg, France

54         A. Ulyanenkov, I.Feranchuk, S.Feranchuk, T.Alexeeva, Novel approach to calculation of X-ray reflection from rough surfaces, Workshop on X-ray micro and nanoprobes:  instruments, methodologies and applications, 11-17 June 2007, Erice, Italy

55         А.Ульяненков, Новые методы интерпретации данных в рентгеновской дифракции высокого разрешения, рефлектометрии и малоугловом рассеянии, VI национальная конференция по применению рентгеновского, синхротронного излучений, нейтронов и электронов для исследования материалов, 12-17 ноября, 2007, Москва, Russia

56         A. Ulyanenkov, M. Myronov, Y. Shiraki, K. Saito, Investigation of strain, relaxation degree, interface roughness and porosity of SiGe/Si MODFET heterostructures (invited), 55th Denver X-ray Conference: p. 31, 7-11 August 2006, Denver, CO, USA.

57         A. Ulyanenkov, M. Myronov, Y. Shiraki, K. Saito, Investigation of strain, relaxation degree, interface roughness and porosity of SiGe/Si MOSFET structures, European Materials Research Society Meeting: p. 233, May 29-June 2, 2006, Nice, France.

58         A. Ulyanenkov, M. Myronov, Y. Shiraki, K. Saito, Investigation of strain, relaxation degree, contamination, interface roughness and dislocation density of SiGe/Si MODFET heterostructures, 8th Biennial Conference on High Resolution X-Ray Diffraction and Imaging: p. 21, 19-22 September 2006, Baden-Baden, Germany.

59         D. Agnihotri, V.E. Asadchikov, E. Bontempi, C-H. Chang, P. Colombi, L. E. Depero, M. Farnworth, T. Fujimoto,  A. Gibaud, M. Jergel, D. Keith Bowen, M. Krumrey, A. Lamperti, T. Lafford, R. J. Matyi, T. Ma, M. Meduna, S. Milita, K. Sakurai, L. Shabel'nikov, A. Ulyanenkov, A. van der Lee, C. Wiemer, X-Ray Reflectivity measurements to evaluate thin films and multilayers thickness: preliminary results of the first world Round-Robin Test, 8th Biennial Conference on High Resolution X-Ray Diffraction and Imaging: p. 76, 18-22 September 2006, Baden-Baden, Germany.

60         A. Ulyanenkov, Novel methods and universal software for HRXRD, XRR and GISAXS data interpretation (invited), European Materials Research Society Meeting: p. 84, Mai 31 - June 3, 2005, Strasbourg, France.

61         A. Ulyanenkov, Novel analytical approaches in numerical analysis of XRR and HRXRD data from thin films (invited), 54th Denver X-ray Conference: p. 147, 1-5 August 2005, Colorado Springs, CO, USA.

62         I.D. Feranchuk, A.S. Lobko, A. Ulyanenkov, Theoretical interpretation of the experiments with high-resolution parametric X-rays, 54th Denver X-ray Conference: p. 69, 1-5 August 2005, Colorado Springs, CO, USA.

63         I.D. Feranchuk, S.I. Feranchuk, L. Komarov, S. Sytova, A. Ulyanenkov, Analytical ansatz for self-consistent calculations of x-ray transmission and reflection coefficients at graded interfaces, Conference on experimental  and  computing methods  in high resolution diffraction  applied  for  structure characterization of  modern materials: p. 45, June 13-17, 2004, Zakopane, Poland.

64         A. Ulyanenkov, R. Eisenhower, I. Feranchuk, H. Guerault, H. Ress, Ultra-fast simultaneous fitting of several Bragg reflections from AlAs/GaAs superlattices using method of eigenwaves, 53rd Denver X-ray Conference: p. 136, 2-6 August 2004, Steamboat Springs, CO, USA.

65         A. Ulyanenkov, Analytical ansatz for self-consistent calculation of x-ray transmission and reflection coefficients at graded interfaces, 8th International Conference on Surface X-ray and Neutron Scattering: p. 155, June 28th - July 2nd 2004, Bad Honnef, Germany.

66         A. Ulyanenkov, LEPTOS: Software for interpretation of X-ray reflectivity and X-ray diffraction data from multilayers and superlattices (invited), 49th Annual Meeting SPIE: p. 173, 2 - 6 August 2004, Denver, CO, USA.

67         A. Ulyanenkov, I. Feranchuk, S. Feranchuk, A. Minkevich, Fast simulation of X-ray reflectivity and diffraction from superlattices, 7th Biennial Conference on High Resolution X-Ray Diffraction and Imaging: p. 16, 10-14 September 2004, Prague, Czech Republic.

68         I. Feranchuk, A. Ulyanenkov, Microscopic calculation of the X-ray susceptibility for arbitrary wavelength, Gordon Research Conference on X-ray Physics, p. 68, July 13-18, 2003, Bristol, RI, USA.

69         A. Ulyanenkov, I. Feranchuk, S. Feranchuk, Simulation of X-ray reflectivity from periodical surface gratings, 51st Denver X-ray Conference: p. 48, 29th July - 2nd August 2002, Colorado Springs, CO, USA.

70         A. Ulyanenkov, Analysis of the factors, influencing the precision of simulated X-ray diffraction (reflection) curves (invited), 51st Denver X-ray Conference: p. 49, 29 July - 2 August, 2002, Colorado Springs, CO, USA.

71         A. Ulyanenkov, Diffuse X-ray scattering as a measure of nanoscale imperfections, 14th American Conference on Crystal Growth and Epitaxy: p. 109, August 4 - 9, 2002, Seattle, WA, USA.

72         A. Ulyanenkov, I. Feranchuk, S. Feranchuk, Exact Analytical Solution for X-ray Reflectivity from Periodical Surface Gratings, 6th Biennial Conference on High Resolution X-Ray Diffraction and Imaging: p. 134, 10-14 September 2002, Grenoble, France.

73         A. Ulyanenkov, I. Feranchuk, A. Minkevich, H. Ress, J. Grenzer, Diffuse X-ray scattering from GaAs/AlAs superlattices: new theoretical approach for data interpretation, 50th Denver X-ray Conference: p. 304, 30th July - 3rd August 2001, Steamboat Springs, CO, USA.

74         A. Ulyanenkov, I. Feranchuk, L.I. Komarov, Calculation of atomic scattering and Debye-Waller factors: step toward accurate estimation for X-ray polarizability, 50th Denver X-ray Conference: p. 55, 30th July - 3rd August 2001, Steamboat Springs, CO, USA.

75         A. Ulyanenkov, I. Feranchuk, A. Minkevich, H. Ress, J. Grenzer, Surfaces and interfaces in Nanostructures, 16th International Conference on X-ray Optics and Microanalysis: p. 32, July 2nd-6th, 2001, Vienna, Austria.

76         A. Ulyanenkov, Coherent x-ray radiation, Gordon X-ray Conference on X-ray Physics: p. 78, July 22-27, 2001, Connecticut College, New London, USA.

77         K. Omote, A. Ulyanenkov, R. Matsuo, K. Shimizu, N. Ishino, M. Nishii, O. Yoda, Evaluation of the interface morphology of Mo/Si and W/Si multilayers by X-ray specular reflectivity and diffuse scattering, 5th International Conference on the Physics of X-Ray Multilayer Structures, p. 57, March 5-9, 2000, Chamonix Mont-Blanc, France.

78         I.D. Feranchuk, A. Ulyanenkov, J. Harada, Interference of Parametric X-ray and Coherent Bremsstrahlung radiation from nonrelativistic electrons,  Application to the phase analysis: p. 16, 49th Denver X-ray Conference, July 31 - August 4, 2000, Denver, CO, USA.

79         A. Ulyanenkov, K. Inaba, K. Omote, J. Harada, M. Ishino, O. Yoda, X-Ray study of Mo/Si multilayers grown on glass substrates, 49th Denver X-ray Conference: p. 225, July 31 - August 4, 2000, Denver, CO, USA.

80         A. Ulyanenkov, X-Ray diffraction analysis of free-standing and buried quantum wires (invited), 49th Denver X-ray Conference: p. 227, July 31 – August 4, 2000, Denver, CO, USA.

81         A. Ulyanenkov, U. Pietsch, K. Omote, N. Darowski, J. Grenzer, K. Inaba, A. Forchel, X-Ray diffraction and reflectivity analysis of free-standing quantum wires, 5th Biennial Conference on High Resolution X-Ray Diffraction and Imaging: p. 32, 13-15 September 2000, Zakopane, Poland.

82         A. Ulyanenkov, I.D. Feranchuk, J. Harada, Phase determination method based on the interference of parametric x-ray and coherent bremsstrahlung radiation, 5th Biennial Conference on High Resolution X-Ray Diffraction and Imaging: p. 103, 13-15 September 2000, Zakopane, Poland.

83         A. Ulyanenkov, K. Inaba, K. Omote, J. Harada, M. Ishino, O. Yoda, X-ray study of Mo/Si multilayers grown on thermally stable substrates, 5th Biennial Conference on High Resolution X-Ray Diffraction and Imaging: p. 104, 13-15 September 2000, Zakopane, Poland.

84         I.D. Feranchuk, A. Ulyanenkov, Application of X-ray radiation from nonrelativistic electrons to thin films and multilayer analysis, 5th Biennial Conference on High Resolution X-Ray Diffraction and Imaging: p. 139, 13-15 September 2000, Zakopane, Poland.

85         A. Ulyanenkov, R. Matsuo, K. Omote, J. Harada, M. Ishino, M. Nishii, O. Yoda, Evaluation of the interface morphology in Mo/Si superlattices by X-ray specular and diffuse scattering, 48th Denver X-ray Conference: p. 128, 2 August – 6 August 1999, Steamboat Springs, CO, USA.

86         A. Ulyanenkov, J. Harada, Application of Genetic Algorithm to the refinement of structure parameters from X-ray reflectivity data. Superlattices and Thin Solid Films, 48th Denver X-ray Conference: p. 109, 2 August – 6 August 1999, Steamboat Springs, CO, USA.

87         A. Ulyanenkov, R. Matsuo, K. Omote, K. Inaba, J. Harada, M. Ishino, M. Nishii, O. Yoda, Investigation of the interface morphology in Mo/Si superlattices by X-ray specular and diffuse scattering, 6th International Conference on Surface X-ray and Neutron Scattering: p. 47, 12-17 September 1999, Noordwijkerhout, The Netherlands.

88         A. Ulyanenkov, J. Harada, The Genetic Algorithm: Refinement of x-ray reflectivity data from multilayers and thin films, 6th International Conference on Surface X-ray and Neutron Scattering: p. 95, 12-17 September 1999, Noordwijkerhout, The Netherlands.

89         I.D. Feranchuk, A. Ulyanenkov, J. Harada, Parametric X-ray radiation from nonrelativistic particles: theory and application for structure analysis, 6th International Conference on Surface X-ray and Neutron Scattering: p. 147, 12-17 September 1999, Noordwijkerhout, The Netherlands.

90         U. Pietsch, A. Ulyanenkov, N. Darowski, J. Grenzer, K.H. Wang, A. Forchel, Evaluation of strain distribution in freestanding and buried lateral nanostructures, 6th International Conference on Surface X-ray and Neutron Scattering: p. 158, 12-17 September 1999, Noordwijkerhout, The Netherlands.

91         A. Ulyanenkov, X-ray diffuse scattering from Mo/Si x-ray mirrors, 4th International School on X-ray Scattering: p. 97, 22-25 September 1999, Smolenice, Slovakia.

92         I.D. Feranchuk, A. Ulyanenkov, N. Osaka, K. Omote, J. Harada, Parametric x-ray radiation in x-ray tubes, Theoretical consideration: p. 186, 47th Denver X-ray Conference, 1-5 August 1998, Colorado Springs, CO, USA.

93         A. Ulyanenkov, R. Matsuo, K. Omote, J. Harada, S.-Y. Matsuno, X-ray reflectivity and diffuse scattering from thin SiO2 film on Si substrate, 47th Denver X-ray Conference: p. 199, 1-5 August 1998, Colorado Springs, CO, USA.

94         A. Ulyanenkov, N. Darowski, U. Pietsch, T. Baumbach, K.H. Wang, A. Forchel, Grazing-incidence X-ray diffraction from semiconductor quantum wires, 47th Denver X-ray Conference: p. 202, 1-5 August, 1998, Colorado Springs, CO, USA.

95         A.Ulyanenkov, N.Darowski, U.Pietsch, T.Baumbach, K.H.Wang, A.Forchel, Grazing-incidence X-ray diffraction from semiconductor quantum wires, 18th European Crystallographic Meeting: p. 37, 16th - 20th August 1998, Prague, Czech Republic.

96         A. Ulyanenkov, A. Takase, M. Kuribayashi, K. Ishida, K. Kimura, L.-H. Kuo, T. Yasuda, S. Miwa, T. Yao, H. Tomita, S. Komiya, Structural characterization of ZnSe/GaAs interface by x-ray reflection, 18th European Crystallographic Meeting: p. 218, 16-20 August 1998, Prague, Czech Republic.

97         A. Ulyanenkov, Accounting for the diffuse component in the grazing-incidence x-ray diffraction from multilayers, 46th Denver X-ray Conference, p. 183, 3-8 August 1997, Denver, CO, USA.

98         A. Ulyanenkov, U. Klemradt, U. Pietsch, Investigation of roughness correlations in partially relaxed GaInAs/GaAs  superlattices by X-ray diffuse scattering, 5th International Conference on Surface X-Ray and Neutron Scattering: p. A8, 12-16 July 1997, Oxford, UK.

99         A. Ulyanenkov, U. Klemradt, U. Pietsch, Probing of strain relaxation in GaInAs/GaAs superlattices by X-ray diffuse scattering, Highlights in x-ray synchrotron radiation research: p. 50, 17-20 November 1997,  ESRF, Grenoble, France.

100     A.P. Ulyanenkov, S.A. Stepanov, U. Pietsch, R. Kohler, Investigation of lateral lattice misfits in multilayers  by grazing-incidence X-ray diffraction,   23rd Course "X-ray and Neutron Dynamical diffraction: Theory and Applications": 9-23 April, 1996, NATO Advanced Study   Institute: Poster Abstracts II, p. 15, Erice, Italy.

101     A.P. Ulyanenkov, S.A. Stepanov, U. Pietsch, R. Kohler, Effect of lateral lattice misfits in multilayers under grazing-incidence X-ray diffraction, 3rd Conference X-ray Topography and High Resolution Diffraction: p. 175, 22-24 April 1996, Palermo, Italy.

102     С.А. Степанов, А.Я. Силенко, А.П. Ульяненков, И.Я. Дубовская,  Многоволновое параметрическое излучение частиц в кристалле, XXVI конференция по взаимодействию заряженных частиц с кристаллами: c. 56, 17-22 мая 1996, МГУ, Москва, Россия.

103     И.Я. Дубовская, С.А. Степанов, А.П. Ульяненков, Многоволновые эффекты в ПРИ при низких энергиях, 5-й российско-японский симпозиум по взаимодействию быстрых заряженных частиц с твердым телом: 4-8 мая 1996, c. 30-31, Белгород, Россия.

104     S.A. Stepanov, A.P. Ulyanenkov, An advanced method for computation of X-ray multiple Bragg diffraction, 2nd European Symposium on X-ray Topography and High Resolution Diffraction: 10-15 September 1994, p. 184, Berlin, Germany.

105     A.P. Ulyanenkov, S.A. Stepanov, Accounting for correlated roughness in X-ray grazing-incidence diffraction, 2nd European Symposium on X-ray Topography and High Resolution Diffraction: 10-15 September 1994, p. 194, Berlin, Germany

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