3 I.Feranchuk, A.Ivanov, V.-H. Le, A.Ulyanenkov, Nonperturbative description of quantum systems, Heidelberg: Springer, to be published in 2015, 362 p.
6
А.П. Ульяненков, Девять
месяцев 1942-го. Демянский плацдарм, Минск: Четыре четверти, 2021, 812
с.
Articles
1
A.
U. Leonau, N. Q. San, A. P. Ulyanenkov, O. D. Skoromnik, and I. D. Feranchuk, Eigenstates
of two-level systems in a single-mode quantum field: from quantum Rabi model to
N-atom Dicke model, arXiv: 2202.03545v1 [quant-ph], 2022
2
A.
Mikhalychev, K. Zhevno, S. Vlasenko, A. Benediktovitch, T. Ulyanenkova, and A.
Ulyanenkov, Fisher information for optimal planning of X-ray diffraction
experiments, Journal of Applied Crystallography, 2021, 54,
1676-1697.
3
A.
Mikhalychev, S. Vlasenko, T.R. Payne, D.A. Reinhard, A. Ulyanenkov, Bayesian
approach to automatic mass-spectrum peak identification in atom probe
tomography, Ultramicroscopy, 2020, 215, 113014
4
T.
Ulyanenkova, A. Zhylik, A. Benediktovitch, and A. Ulyanenkov, Computation and
visualization of accessible reciprocal space and resolution element in
high-resolution X-ray diffraction mapping, arXiv:1809.10951
[cond-mat.mtrl-sci], 2018
5
S.
Vlasenko, A. Benediktovitch, A. Ulyanenkov, V. Uglov, G. Abadias, J. O’Connell,
A. Janse van Vuuren, Microstructure characterization of multilayer thin
coatings ZrN/Si3N4 by X-ray diffraction using noncoplanar
measurement geometry, Physica Status Solidi A: Applications and
Materials Science, 2018, 215,
Issue 5, 1700670 (1-9)
6
O.D.Skoromnik,
V.G.Baryshevsky, A.P.Ulyanenkov, I.D.Feranchuk, Radical increase of the
parametric X-ray intensity under condition of extremely asymmetric diffraction,
Nuclear
Inst. and Methods in Physics Research B, 2017, 412, 86-92
7
V.
Kaganer, T. Ulyanenkova, A. Benediktovitch, M. Myronov, and A. Ulyanenkov,
Bunches of misfit dislocations on the onset of relaxation of Si0.4Ge0.6/Si(001)
epitaxial films revealed by high-resolution x-ray diffraction, Journal
of Applied Physics, 2017, 50,
776-786
8
V.
Kaganer, T. Ulyanenkova, A. Benediktovitch, M. Myronov, A. Ulyanenkov, Bunches
of misfit dislocations on the onset of relaxation of Si0.4Ge0.6/Si(001)
epitaxial films revealed by high-resolution x-ray diffraction, arXiv:1706.02954
9
I.
Lobach, A. Benediktovitch, A. Ulyanenkov, Incorporation of interfacial
roughness into recursion matrix formalism of dynamical X-ray diffraction in
multilayers and superlattices, J. Appl. Cryst., 2017, 50, 681-688
10
A.
Mikhalychev and A. Ulyanenkov, Bayesian approach to powder phase
identification, J. Appl. Cryst., 2017, 50,
776-786
11
A.
Mikhalychev, A. Benediktovitch, T. Ulyanenkova, A. Ulyanenkov, Ab initio simulation
of diffractometer instrumental function for high-resolution X-ray diffraction, J.
Appl. Cryst., 2015, 48,
679-689
12
A.
Benediktovitch, A. Zhylik, T. Ulyanenkova, M. Myronov, A. Ulyanenkov, Characterization
of dislocations in germanium layers grown on (011)- and (111)-oriented silicon
by coplanar and noncoplanar X-ray diffraction, J. Appl. Cryst., 2015, 48, 1-11
13
T.
Ulyanenkova, M.Myronov, A.Ulyanenkov, Boron doped cubic silicon probed by
high-resolution X-ray diffraction, Phys. Status Solidi C 12 (3), 255–258 (2015)
14
D.
Nikolaev, T.A. Lychagina, M. Rusetsky, A. Ulyanenkov, A. Sasaki, Internal
optimization of the texture component approximation method, , 1-5 (2015)
15
A.
Benediktovitch, T. Ulyanenkova, J. Keckes, A. Ulyanenkov, Sample tilt-free
residual stress gradient characterization in TiN coating using in-plane arm lab
X-ray diffractometer, J. Appl. Cryst., 2014, 47, 1931-1938
16
A.
Benediktovitch, T. Ulyanenkova and A. Ulyanenkov, Resolution function for X-ray
powder diffraction in non-coplanar measurement geometry with two degree of
freedom detector arm, J. Appl. Cryst., 2014, 47, 1298-1303
17
T.Ulyanenkova,
A.Benediktovitch, M.Myronov, J.Halpin, S.Rhead, and A.Ulyanenkov, Stress of
homogeneous and graded epitaxial thin films studied by full-shape analysis of
high resolution reciprocal space maps, Material Science Forum, 768-769, 249-256, 2014
18
A.
Benediktovitch, T. Ulyanenkova, J. Keckes, A. Ulyanenkov, Stress gradient
analysis by non-coplanar X-ray diffraction and corresponding refraction
correction, Advanced Material Research, 996, 162-168, 2014
19
V.
Uglov, V. Skuratov, T. Ulyanenkova, A. Benediktovitch, A. Ulyanenkov, S.
Zlotsky, Residual stress state in oxide dispersive steel due to irradiation by
swift heavy ions, Advanced Material Research, 996, 22-26, 2014
20
T.Ulyanenkova,
M.Myronov, A.Benediktovitch, A.Mikhalychev, J.Halpin and A.Ulyanenkov, Characterization
of SiGe thin films using a laboratory X-ray instrument, J. Appl. Cryst., 2013, 46, 898-902
21
A.Zhylik,
A.Benediktovitch, I.Feranchuk, K.Inaba, A.Mikhalychev and A.Ulyanenkov,
Covariant description of X-ray diffraction from anisotropically relaxed
epitaxial structures, J. Appl. Cryst., 2013, 46, 919-925
22
A.Zhylik,
A.Benediktovich, A.Ulyanenkov, H.Guerault, M.Myronov, A.Dobbie, D.R.Leadley,
T.Ulyanenkova, High-resolution X-ray diffraction investigation of relaxation
and dislocations in SiGe layers grown on (001), (011), and (111) Si substrates,
J.
of Applied Physics, 123714, 109 (2011)
23
A.Benediktovich,
H.Guerault, I.Feranchuk, V.Uglov, A.Ulyanenkov, Influence of surface roughness
on evaluation of stress gradients in coatings,
Materials Science Forum, 121,
681 (2011)
24
A.Benediktovich,
I.Feranchuk, A.Ulyanenkov, Calculation of X-ray stress factors using vector
parameterization and irreducible representations for SO(3) group, Materials
Science Forum, 387, 681
(2011)
25
A.
Zhylik, F. Rinaldi, M. Myronov, K. Saito, S. Menzel, A. Dobbie, D. R. Leadley,
T. Ulyanenkova, I. D. Feranchuk, and A. Ulyanenkov, High-resolution reciprocal
space mapping of distributed Bragg reflectors and virtual substrates, Phys.
Status Solidi A 208 (11),
2582–2586 (2011)
26
A.
Ulyanenkov, J. Chrost, P. Siffalovic, L. Chitu, E. Majkova, K. Erlacher, H.
Guerault, G. Maier, M. Cornejo, B. Ziberi, and F. Frost, GISAXS and AFM study
of self-assembled Fe2O3 nanoparticles and Si nanodots, Phys.
Status Solidi A 208 (11),
2619–2622 (2011)
27
A.
Benediktovitch, F. Rinaldi, S. Menzel, K. Saito, T. Ulyanenkova, T. Baumbach,
I. D. Feranchuk, and A. Ulyanenkov, Lattice tilt, concentration, and relaxation
degree of partly relaxed InGaAs/GaAs structures, Phys. Status Solidi A 208 (11), 2539–2543 (2011)
28
A.Benediktovich,
A.Ulyanenkov, F.Rinaldi, K.Saito, V.M.Kaganer, Concentration and relaxation
depth profiles of InxGa1−xAs/GaAs and GaAs1−xPx/GaAs
graded epitaxial films studied by x-ray diffraction, Phys. Rev. B, 035302, 84 (2011)
29
A.
I. Benediktovich, I. D. Feranchuk, and A. Ulyanenkov, X-ray dynamical diffraction from partly relaxed epitaxial structures, Phys.
Rev. B, 235315, 80 (2009)
30
Коршунов Ф. П., Алексеева Т. А., Злоцкий С. В.,
Лазарь А. П., Углов В. В., Ульяненков А. П, Неразрушающий анализ GIXRD
методом градиентных остаточных напряжений в поликристаллических покрытиях, Доклады Национальной
Академии Наук Беларуси, 52 (3),
2008, 41-47
31
P. Colombi, D. K. Agnihotri,
V. E. Asadchikov, E. Bontempi, D. K. Bowen, C. H. Chang, L. E. Depero, M. Farnworth,
T. Fujimoto, A. Gibaud, M. Jergel, M. Krumrey, T. A. Lafford, A. Lamperti, T. Ma,
R. J. Matyi, M. Meduna, S. Milita, K. Sakurai, L. Shabel’nikov, A. Ulyanenkov, A.
Van der Lee and C. Wiemer, Reproducibility in X-ray reflectometry: results from
the first world-wide round-robin experiment, J. Appl. Cryst. (2008) 41, 143–152
32
T.
A. Alexeeva, A. I. Benediktovich, I. D. Feranchuk, T. Baumbach, and A.
Ulyanenkov, Long-range scans and
many-beam effects for high-resolution X-ray diffraction from multilayered
structures: Experiment and theory, Phys.
Rev. B, 174114, 77 (2008)
33
V.V.
Uglov, V.M. Anishchik, S.V. Zlotski, I.D. Feranchuk, T.A. Alexeeva, A.
Ulyanenkov, J. Brechbuehl, A.P. Lazar, Composition and phase stability upon
annealing of gradient nitride coatings, Surface & Coatings Technology 202 (2008) 2389–2393
34
V.G. Baryshevsky, K.G. Batrakov, I.D. Feranchuk, A.A. Gurinovich, A.O.
Grubich, A.S. Lobko, A.A. Rouba, B.A. Tarnopolsky, P.F. Safronov, V.I.
Stolyarsky, A.P. Ulyanenkov, Experimental
observation of frequency tuning of X-ray radiation from nonrelativistic
electrons in crystals, Physics Letters A363 (2007)
448-452
35
V.G. Baryshevsky, K.G. Batrakov, I.D. Feranchuk, A.A. Gurinovich, A.O.
Grubich, A.S. Lobko, A.A. Rouba, B.A. Tarnopolsky, P.F. Safronov, V.I.
Stolyarsky, A.P. Ulyanenkov, Experimental
observation of frequency tuning of X-ray radiation from nonrelativistic
electrons with a silicon crystal, X-ray Spectrometry 36 (2007) 343-347
36
I. D. Feranchuk, S. I. Feranchuk,
and A. P. Ulyanenkov, Self-consistent approach to x-ray reflection from
rough surfaces, Phys.Rev.B 75
(2007) 085414
37
T. A. Alexeeva, V. V.
Uglov, V. M. Anishchik, S. V. Zlotski, J. Brechbühl, H. Guerault,
A. Lazar, A. Ulyanenkov, and T. Baumbach, Stress And Composition Evaluation For Gradient Nitride
Coatings, Advances in X-ray Analysis
(Powder Diffraction), 52 (2007) 1-7
38
B.He,
A.Ulyanenkov, Residual Stress Analysis With Multiple
HKL Rings Collected By Area Detectors, Advances in X-ray Analysis
(Powder Diffraction), 52
(2007) 187-192
39
A.
Ulyanenkov, Universal software for residual stress evaluation from 1D and 2D
x-ray diffraction data, Powder Diffraction 22(2)
(2007) 186
40
A.
Ulyanenkov, Novel methods and universal software for HRXRD, XRR and GISAXS data
interpretation, Applied Surface Science, 2006, 253 (1), 106-111.
41
A.
Ulyanenkov, LEPTOS User Manual, Karlsruhe: Bruker AXS GmbH, 2006, 297 p.
42
В.Г.Барышевский, К.Г. Батраков,
А.О. Грубич, А.А. Гуринович, А.С. Лобко, А.А. Ровба, П.Ф. Сафронов, В.И.
Столярский, Б.А. Тарнопольский, А.П. Ульяненков, И.Д. Феранчук, Когерентное
тормозное и параметрическое рентгеновское излучение от нерелятивистских электронов
в кристалле, Письма в ЖЭТФ, 2006, 32,
50-56.
43
V. G. Baryshevsky, K. G. Batrakov, I. D. Feranchuk,
A. O. Grubich, A. A. Gurinovich*, A. S. Lobko, A. A. Rouba, P. F. Safronov, V.
I. Stolyarsky, B. A. Tarnopolsky, and A. P. Ulyanenkov, Coherent Bremsstrahlung
and Parametric X-ray Radiation from Nonrelativistic Electrons in a Crystal, Technical Physics Letters, 2006, 32 (5), pp. 392–395
44
K.Saito,
A.Ulyanenkov, V.Grossmann, H.Ress, L.Bruegemann, H.Ohta, T.Kurosawa, S.Ueki and
H.Funakubo, Structural Characterization of BiFeO3 Thin Films by
Reciprocal Space Mapping, Japanese Journal of Applied Physics,
45 (9B), 2006, 7311-7314
45
A.
Ulyanenkov, S. Sobolewski, Extended genetic algorithm: Application to X-ray
analysis, J. of Physics D: Appl.Phys., 2005, 38, 235-238.
46
I.
Feranchuk, O. Lugovskaya, A. Ulyanenkov, Dynamical diffraction theory for the
parametric X-rays and coherent bremsstrahlung, Nucl.Instrum and Meth. B,
2005, 234, 148-158.
47
I.D.
Feranchuk, A. Ulyanenkov, Anomalous scattering method in crystallography on the
basis of the parametric X-ray radiation, Acta Cryst.A., 2005, 61,
125-133.
48
V.G.
Baryshevsky, K.G. Batrakov, I.D. Feranchuk, A.A. Gurinovich, A.O. Grubich, A.S.
Lobko, A.A. Rouba, B.A. Tarnopolsky, P.F. Safronov, V.I. Stolyarsky, A.P. Ulyanenkov,
Experiments with Parametric X-Ray Radiation (PXR) from Non-Relativistic
Electrons, arXiv:physics/0507036 [physics.ins-det], 2005.
49
A.
Ulyanenkov, LEPTOS: Software for interpretation of X-ray reflectivity and X-ray
diffraction data from multilayers and superlattices, Proc.of SPIE, 2004, 5536, 1-15.
50
A.
Ulyanenkov, R. Eisenhower, I. Feranchuk, H. Guerault, H. Ress, Ultra-fast
simultaneous fitting of several Bragg reflections from AlAs/GaAs superlattices
using method of eigenwaves, Powder Diffraction, 2004, 19 (2), 195-196.
51
A.
Ulyanenkov, R. Eisenhower, H. Guerault, H. Ress, Simultaneous fitting of
several Bragg reflections, Global Semiconductor, 2004, 7, 28-29.
52
I.D.
Feranchuk, A.Ulyanenkov, Realization of the anomalous scattering method in
crystallography on the basis of the parametric X-ray radiation, arXiv:cond-mat/0312310
[cond-mat.mtrl-sci], 2003
53
I.D.
Feranchuk, S.I. Feranchuk, L.I. Komarov, S.I. Sytova, A.P. Ulyanenkov,
Analytical ansatz for self-consistent calculations of X-ray transmission and
reflection coefficients at graded interfaces, Phys. Rev. B, 2003, 67, 235417-235429.
54
I.
D. Feranchuk, S. I. Feranchuk, A. A. Minkevich, and A. Ulyanenkov, Description
of X-ray reflection and diffraction from periodical multilayers and
superlattices by the eigenwave method, Phys. Rev. B, 235307 68
(2003)
55
I.D.
Feranchuk, A.A. Minkevich, A.P. Ulyanenkov,
About non-Gaussian behaviour of the Debye-Waller factor at large scattering
vectors, Europ. Phys. Journ.: Applied Physics, 2003, 24, 21-26.
56
I.D.
Feranchuk, L.I. Gurskii, L.I. Komarov, O.M. Lugovskaya, F. Burgazy, A.
Ulyanenkov, A new method for calculation of crystal susceptibilities for X-ray
diffraction at arbitrary wavelength, Acta Cryst. A, 2002, 58, 370-384.
57
I.D.
Feranchuk, L.I. Komarov, A.P. Ulyanenkov, Control of the atom (nucleus)
lifetime in the excited state by means of a low-frequency external field, J.Phys.B:
At.Mol.Opt.Phys., 2002, 35,
3957-3965.
58
I.D.
Feranchuk, A.A. Minkevich, A.P. Ulyanenkov, Estimation of the Debye temperature
for crystals with polyatomic unit cell, Europ. Phys. Journ.: Applied Physics,
2002, 19, 95-101.
59
I.D.
Feranchuk, A.P. Ulyanenkov, Transition radiation from electrons: Application to
thin film and superlattice analysis, Phys. Rev. B, 2001, 63, 155318.
60
A.
Ulyanenkov, K. Inaba, P. Mikulik, N.
Darowski, K. Omote, U. Pietsch, J. Grenzer, A. Forchel, X-ray diffraction and
reflectivity analysis of GaAs/GaInAs free-standing trapezoidal quantum wires, J.Phys.D:
Appl.Phys., 2001, 342,
A179-A185.
61
I.D.
Feranchuk, A. Ulyanenkov, Interference of parametric x-ray and coherent
bremsstrahlung radiation from nonrelativistic electrons: application to the
phase analysis in crystallography, Acta Crystal. A, 2001, 57, 283-289.
62
I.D.
Feranchuk, A. Ulyanenkov, J. Harada, J.C.H. Spence, Parametric x-ray radiation
and coherent bremsstrahlung from nonrelativistic electrons in crystals, Phys.
Rev. E, 2000, 62, 4225-4234.
63
K.
Omote, J. Harada, A. Ulyanenkov, T.C. Huang, Characterization of surfaces and
thin films using a Rigaku grazing-incidence
diffractometer, Nuclear Science Journal of Malaysia, 2000, 18, 170-184.
64
U.
Pietsch, N. Darowski, J. Grenzer, A. Ulyanenkov, K.H. Wang, A.
Forchel, Interpreting of photoluminescence data from lateral nanostructures on the basis of internal
strain distribution, Physica B, 2000, 283, 92-96.
65
A.
Ulyanenkov, R. Matsuo, K. Omote, K. Inaba, J. Harada, M. Ishino, M.Nishii,
O.Yoda, X-ray scattering study of interfacial roughness correlation in Mo/Si
multilayers fabricated by ion beam sputtering, J.Appl.Phys., 2000, 87, 7255-7260.
66
A.
Ulyanenkov, K. Omote, J. Harada, The genetic algorithm: refinement of X-ray
reflectivity data from multilayers and thin films, Physica B, 2000, 283, 237-241.
67
A.
Ulyanenkov, K. Omote, J. Harada, The evaluation of structure parameters of a
Mo/Si superlattice using x-ray scattering data and a genetic algorithm, Advances
in X-ray Analysis (Powder Diffraction), 2000, 43, 53-64.
68
I.D.
Feranchuk, A.P. Ulyanenkov About new applications of the parametric X-ray
radiation for crystallography, Acta Crystal. A, 1999, 55, 466-470.
69
A.
Ulyanenkov, T. Baumbach, N. Darowski, U. Pietsch, K.H. Wang, A. Forchel, T.
Wiebach, Investigation of in-plane strain distribution in free-standing
GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001], J.Appl.Phys.,
1999, 85, 1524-1530.
70
A.
Ulyanenkov, N. Darowski, J. Grenzer, U. Pietsch, K.H. Wang, A.
Forchel, Evaluation of strain distribution in freestanding and buried lateral
nanostructures, Phys.Rev. B, 1999, 60,
16701-16714.
71
A.
Ulyanenkov, K. Omote, R. Matsuo, J. Harada, S.-Y. Matsuno, Specular and
nonspecular x-ray scattering study of SiO2/Si structures, J.Phys.D:
Appl.Phys., 1999, 32,
1313-1318.
72
A.
Ulyanenkov, A. Takase, M. Kuribayashi, K. Ishida, A. Ohtake, K. Arai, T.
Hanada, T. Yasuda, T. Yao, H. Tomita, S. Komiya, X-ray reflectivity from
ZnSe/GaAs heterostructures, J.Appl.Phys., 1999, 85, 1520-1523.
73
A.
Ulyanenkov, Grazing-incidence x-ray diffraction from multilayers, taking into
account diffuse scattering from rough interfaces, Appl.Phys. A, 1998, 66, 193-199.
74
A.
Ulyanenkov, U. Klemradt, U.Pietsch, Investigation of strain relaxation in
GaInAs/GaAs superlattices by x-ray diffuse scattering, Physica B, 1998, 248, 25-30.
75
С.А. Степанов, А.Я. Силенко, А.П.
Ульяненков, И.Я. Дубовская, Многоволновое параметрическое рентгеновское
излучение частиц в кристаллах, Поверхность: Физика, химия, механика,
1997, 8, 61-64.
76
I.D.
Feranchuk, L.I. Komarov, A.P. Ulyanenkov, Two-level system in a one-mode
quantum field: numerical solution on the basis of the operator method, J.Phys.A:
Math. Gen., 1996, 29,
4035-4047.
77
S.A.
Stepanov, A.Ya. Silenko, A.P. Ulyanenkov, I.Ya. Dubovskaya, Multi-wave
parametric X-ray production by relativistic particles in crystals: comparison
of computations and experimental results, Nuclear Instrum. Methods. B, 1996, 117, 55-67.
78
I.D.
Feranchuk, L.I. Komarov, I.V. Nichipor, A.P. Ulyanenkov, Operator method in the
problem of quantum anharmonic oscillator, Ann. Phys. N.Y., 1995, 238, 370-440.
79
A.P.
Ulyanenkov, S.A. Stepanov, U. Pietsch, R. Kohler, A dynamical diffraction approach
to grazing-incidence X-ray diffraction by multilayers with lateral lattice
misfits, J.Phys. D: App. Phys., 1995, 28, 2522-2529.
80
I.D.
Feranchuk, I.V. Nichipor, A.P. Ulyanenkov, Program complex for the description
of electromagnetic processes during planar and axial channeling of relativistic
particles, Nucl. Instr. and Methods in Phys. Research B., 1994, 88,
369-381.
81
S.A.
Stepanov, A.P. Ulyanenkov, A new algorithm for computation of X-ray multiple
Bragg diffraction, Acta Crystallographica A, 1994, 50, 579-585.
82
I.Ya.
Dubovskaya, S.A. Stepanov, A.Ya. Silenko, A.P. Ulyanenkov, Computation of
parametric X-ray production by relativistic particles in crystals under
multiple Bragg diffraction, J. Phys. C: Condens.Matter, 1993, 5, 7771-7784.
83
И.В. Ничипор, А.П. Ульяненков,
И.Д. Феранчук, Решение уравнения Шредингера для квантовых систем в
периодических полях, Вестник БГУ. Сер. 1. Математика.
Физика. Информатика, 1991, 3, 47-52.
84
I.D.
Feranchuk, A.P. Ulyanenkov, V.S. Kuz'min, Specific heat from an unsymmetrical
double well potential, Chem. Phys., 1991, 157, 61-66.
85
В.С. Кузьмин, А.П. Сайко, А.П.
Ульяненков, Фазовый переход порядок-порядок в обощенной модели Дике с учетом
адиабатического электрон-фононного взаимодействия, Теоретическая и математическая
физика, 1989, 80, №3, 453-438.
Patents:
1
Method
of fast simulation and fitting of X–ray spectra from superlattices: European
Patent EP1469302 A1 / I. Feranchuk, A. Ulyanenkov; applicant Bruker AXS GmbH.
--- EP20030008687 20030416; appl. 16.04.03; published 20.10.04 // European
Patent Office.
2
X-ray
generating method and device: Japan Patent P2000-30892 / J. Harada, S. Hayashi,
K. Omote, V.G. Baryshevski, I.D. Feranchuk, A.P. Ulyanenkov; applicant RIGAKU
CORP --- 10-192182; appl. 07.07.98; published 28.01.00 // Japanese Patent
Office.
3
A
method for characterization about the uniformity of density in thin films, and
its apparatus and system: Japan Patent P2001-349849A / K. Omote, A. Ulyanenkov,
S. Kawamura; applicant RIGAKU CORP --- N WO 01/75426; appl. 04.04.00; published
30.03.01 // Japanese Patent Office.
4
Analyzing
method for non-uniform-density sample and device and system thereof: patent US
20030157559 A1 / K. Omote, A. Ulyanenkov, S. Kawamura; appl. WENDEROTH, LIND
& PONACK, L.L.P. --- N 2001-088656; appl. 30.03.01; published 21.08.03 //
United States Patent Office.
5
A
method for material structure analysis and its apparatus: Japan Patent
P2001-83106 / A.P. Ulyanenkov, J. Harada; applicant RIGAKU CORP --- N
2001-83106; appl. 10.09.99; published 30.03.01 // Japanese Patent Office.
6
Method
of determining parameters of a sample by X-ray scattering applying an extended
genetic algorithm with truncated use of the mutation operator: US Patent
Application 20050074097 / A.Ulyanenkov, S.Sobolevski; applicant Bruker AXS
GmbH. --- 20050074097; appl. 30.09.04; published 07.04.05 // United States
Patent Office.
7
Method
of determining parameters of a sample by X-ray scattering applying an extended
genetic algorithm including a movement operator: US Patent 7,110,492 / A.
Ulyanenkov, S. Sobolevski; applicant Bruker AXS GmbH. --- N 10/952,800; appl.
30.09.04; published 19.09.06 // United States Patent Office.
8
Determining
parameters of a sample by X–ray scattering applying a genetic algorithm with
integrated gradient method: European Patent EP1522959 A1 / A. Ulyanenkov, S.
Sobolevski; applicant Bruker AXS GmbH. --- N 03022421.6; appl. 07.10.03;
published 13.04.05 // European Patent Office.
9
Determining
parameters of a sample by X–ray scattering applying an extended genetic
algorithm with truncated use of the mutation operator: European Patent
EP1522958 A1 / A. Ulyanenkov, S. Sobolevski; applicant Bruker AXS GmbH. --- N
03022420.8; appl. 07.10.03; published 13.04.05 // European Patent Office.
10
X-ray
diffraction method for residual stress gradient determination using in-plane
diffractometer arm: European Patent application EP14166206.4 / A.Benediktovitch,
T.Ulyanenkova, A.Ulyanenkov; applicant Rigaku Europe SE // European Patent
Office
Conferences:
1
A.
Ulyanenkov, A. Mikhalychev, N. Lappo, AI-powered 3D ion identification for
atom-probe tomography, Pittsburgh Conference, 1-5 March, 2020, Chicago, IL, USA
2
A.
Ulyanenkov, A. Mikhalychev, S. Vlasenko, N. Lappo, I. Perapechka, Artificial
Intelligence Methods in Analytical Data Interpretation: Bayesian Approach and
Fisher Information, Denver X-ray Conference, 5-9 August, 2019, Chicago, IL, USA
3
A.
Ulyanenkov, A. Mikhalychev, S. Vlasenko, Bayes’ formula and Fisher information
for automated analysis of mass spectra, 67th ASMS Conference on Mass
Spectrometry, 2-6 June, 2019, Atlanta, GA, USA
4
A.
Mikhalychev, N. Lappo, S. Vlasenko, A. Ulyanenkov, Automatic Mass Spectrum Peak
Labeling by Maximal Likelihood Estimate in Atom Probe Tomography, Material Research
Society Spring Meeting, p.27, 22-26 April, 2019, Phoenix, AZ, USA
5
A.
Ulyanenkov, A. Mikhalychev, S. Vlasenko, Bayesian approach to automatic
recognition of ion patterns in mass spectra, The Pittsburgh Conference on Analytical
Chemistry and Applied Spectroscopy, 17-21 March, 2019, Philadelphia, PA, USA
6
A. Ulyanenkov, S. Vlasenko, A. Mikhalychev, V. Uglov, G. Abadias, J. O'Connell, A. J. van Vuuren,
Investigation of microstructure of irradiated multilayer ZrN/Si3N4
thin coatings revealed by X-ray diffraction techniques (invited), International Conference “Engineering of Scintillation
Materials and Radiation Technologies”, 9-12 October, 2018, Minsk, Belarus
7
N. Lappo, A. Mikhalychev, M. Zimmermann, A. Benedix, A. Ulyanenkov,
Optimal design of HRXRD measurements by maximizing expected information gain, 14th
Biennial Conference on High-Resolution
X-Ray Diffraction and Imaging, 3-7 September, 2018, Bari, Italy
8
A.
Mikhalychev, N. Lappo, M. Zimmermann, A. Benedix, A. Ulyanenkov, Bayesian
approach to automatic peak indexing in HRXRD, 14th Biennial Conference on
High-Resolution X-Ray Diffraction and Imaging, 3-7 September, 2018, Bari, Italy
9
S.
Vlasenko, A. Mikhalychev, M. Zimmermann, A. Benedix, A. Ulyanenkov, Universal
symmetry analysis in evaluating texture using WIMV approach, 14th Biennial
Conference on High-Resolution X-Ray Diffraction and Imaging, 3-7 September, 2018,
Bari, Italy
10
A.
Mikhalychev, N. Lappo, A. Ulyanenkov, Bayesian approach to automated mass
spectrum peak identification in atom probe tomography, XXII International Mass
Spectrometry Conference, 26-31 August, 2018, Florence, Italy
11
A.
Ulyanenkov, S.Vlasenko, V.Uglov, G. Abadias, A.Benediktovitch, J. O’Connell, A.
J. van Vuuren, Study of multilayer microstructure by XRD using noncoplanar
measurement geometry, 24th Congress and General Assembly of the
International Union of Crystallography, 21-28 August 2017, Hyderabad, India
12
A.
Mikhalychev, A. Benediktovitch, A. Ulyanenkov, Simulation of resolution effects
in HRXRD by semi-analytical ray-tracing, 13th Biennial Conference on
High-Resolution X-Ray Diffraction and Imaging, 4-8th September,
2016, Brno, Czech Republic
13
I.
Lobach, A. Benediktovitch, A. Ulyanenkov, Incorporation of interfacial
roughness to recursion matrix formalism of dynamical x-ray diffraction in
multilayers and superlattices, 13th Biennial Conference on High-Resolution
X-Ray Diffraction and Imaging, 4-8th September, 2016, Brno, Czech Republic
14
A.
Benediktovitch, T.Ulyanenkova, A. Mikhalychev, V.M. Kaganer, M. Myronov, A.
Ulyanenkov, Misfit dislocation density determination at relaxation onset:
reciprocal space map analysis of thin SiGe/Si layers, 13th Biennial Conference
on High-Resolution X-Ray Diffraction and Imaging, 4-8th September,
2016, Brno, Czech Republic
15
A.
Mikhalychev, A. Ulyanenkov, Bayesian approach to phase identification from
powder diffraction data, 15th EPDIC conference, 12-15 June 2016,
Bari, Italy
16
A.
Benediktovitch, A. Mikhalychev, T. Ulyanenkova, M. Myronov, V.M. Kaganer, A.
Ulyanenkov, X-ray diffraction analysis of misfit dislocations if SiGe/Si thin
layers: the role of finite thickness on dislocation induced peak shape, 15th
EPDIC conference, 12-15 June 2016, Bari, Italy
17
A.Ulyanenkov,
A.Benediktovitch, T.Ulyanenkova, J.Keckes, Analysis of residual stress
gradients by X-ray diffraction with five-axis diffractometer, 12th
International Conference on the Mechanical Behavior of Materials, 10-14 May,
2015, Karlsruhe, Germany
18
A.Ulyanenkov,
A.Benediktovitch, T.Ulyanenkova, J.Keckes, Analysis of residual stress
gradients by X-ray diffraction with five-axis diffractometer, Size-Strain
conference, 21-24 September, 2015, Oxford, United
Kingdom
19
D.
Nikolayev, T. Lychagina, M. Rusetsky, A. Ulyanenkov, A. Sasaki, Internal
optimization of the texture component approximation method, 17th International
Conference on Textures of Materials, August 24 – 29, 2014, Dresden, Germany
20
M.
Rusetsky, A. Ulyanenkov, D. Nikolayev, T. Lychagina, New software for
quantitative texture analysis, 17th International Conference on Textures of
Materials, August 24 – 29, 2014, Dresden, Germany
21
A.Zhylik,
A.Benediktovitch, I.Feranchuk, T.Ulyanenkova, A.Ulyanenkov, Accessible
reciprocal space and resolution element of vertical goniometer with extra axis
for non-coplanar diffraction, 12th Conference on High-Resolution X-Ray
Diffraction and Imaging, 14-19 September, 2014, Grenoble, France
22
A.Benediktovitch,
A.Zhylik, T.Ulyanenkova, M.Myronov, A.Ulyanenkov, Characterization of
dislocations in germanium layers grown on (011) and (111) oriented silicon by
coplanar and non-coplanar X-ray diffraction, 12th Conference on High-Resolution
X-Ray Diffraction and Imaging, 14-19 September, 2014, Grenoble, France
23
A.Mikhalychev,
A.Benediktovitch, T.Ulyanenkova, A.Ulyanenkov, Ab initio simulation of diffractometer
instrumental function for HRXRD, 12th Conference on High-Resolution X-Ray
Diffraction and Imaging, 14-19 September, 2014, Grenoble, France
24
A.Benediktovitch,
T.Ulyanenkova, J.Keckes, A.Ulyanenkov, Residual stress gradient measurement by
diffractometer equipped with in-plane arm, 9th European Conference on Residual
Stresses, 7-10 July 2014, Troyes, France
25
V.Uglov,
V.Skuratov, T.Ulyanenkova, A.Benediktovitch, Janse van Vuuren, J.Neethling,
A.Ulyanenkov, Residual stress state in oxide dispersive steel due to
irradiation by swift heavy ions, 9th European Conference on Residual Stresses,
7-10 July 2014, Troyes, France
26
K.Saito, R.Yokoyama, K.Inaba, R.Yasukawa, A.Ulyanenkov, XRD Solution on Stress Analysis from Rigaku, Herbstsitzung des FA Eigenspannungen,
12–13 November 2013, Ettlingen, Germany
27
Benediktovitch, T. Ulyanenkova, J. Keckes, A.
Ulyanenkov, Residual
Stress Gradient Measurement by Diffractometer Equipped with In-plane Arm, Herbstsitzung des FA Eigenspannungen, 12–13 November 2013, Ettlingen, Germany
28
A.Benediktovitch,
A.Ulyanenkov, Modification of line profile analysis methods for thin film
materials study, Denver X-ray Conference, 6-10 August 2012, Denver, CO, USA
29
A.Benediktovitch,
A.Ulyanenkov, Strain and composition depth profile in graded epitaxial thin
films studied by high resolution reciprocal space mapping, The 9th
International Conference on Residual Stresses, October 7-9, 2012. Garmisch-Partenkirchen, Germany
30
A.Zhylik,
A.Benediktovich, I.D.Feranchuk, K.Inaba, A.Mikhalychev, A.Ulyanenkov, Invariant
parameters for description of X-ray diffraction from anisotropically relaxed
epitaxial structures, 11th Biennial Conference on High Resolution X-Ray
Diffraction and Imaging, September 15-20, 2012, Saint-Petersburg, Russia
31
A.Benediktovitch,
I.Feranchuk, A.Ulyanenkov, Theory of high resolution X-ray diffraction in
nonperfect crystals: statistical dynamical theory beyond the framework of
Takagi-Taupin approximation, 11th Biennial Conference on High Resolution X-Ray
Diffraction and Imaging, September 15-20, 2012, Saint-Petersburg, Russia
32
T.A.Ulyanenkova,
K.Saito, M.Myronov, A.P.Ulyanenkov, Characterization of SiGe thin films by
lab-type X-ray instrument, 11th Biennial Conference on High Resolution X-Ray
Diffraction and Imaging, September 15-20, 2012, Saint-Petersburg, Russia
33
A.Ulyanenkov,
A.Benediktovitch, A.Zhilik, T.Ulyanenkova, I.Feranchuk, K.Saito, Coherent and
incoherent X-ray scattering from partly relaxed semiconductor structures
possessing dislocations, Denver X-ray Conference, 1-5 August 2011, Colorado
Springs, CO, USA
34
A.Benediktovitch,
A.Ulyanenkov, A.Zhilik, T.Ulyanenkova, I.Feranchuk, K.Saito, M.Myronov, X-ray
diffraction analysis of strain and composition profiles of graded epitaxial
films, Size-Strain VI, 17-20 October 2011, Hyeres, France
35
H.Morioka,
K.Saito, F.Rinaldi, S.Menzel, I.Feranchuk, A.Zhilik, A.Benediktovich,
A.Ulyanenkov, Stress relaxation in epitaxial thin films revealed by simulation
of X-ray diffraction reciprocal space maps, International Symposium on Compound
Semiconductors, May 31 – June 4, 2010, Kagawa, Japan
37
A. Ulyanenkov,
J.Chrost, P.Siffalovic, L.Chitu, E.Majkova, K. Erlacher, G. Maier, M.
Cornejo, B. Ziberi and F. Frost, GISAXS study of FeO and Si nanoparticles, 7th
LEPTOS User Meeting, 19-21 July 2010,
Minsk, Belarus
38
A.Ulyanenkov
, A. Lazar, H.Guerault, Combined residual stress and texture evaluation of TixCr1-xN
coatings, 7th LEPTOS User Meeting, 19-21 July 2010, Minsk, Belarus
39
A.Ulyanenkov,
F.Rinaldi, S.Menzel, A.Benediktovitch, K.Saito, A.Zhilik, I.Feranchuk, High-resolution
reciprocal space mapping of InGaAs/GaAs structures: from pseudomorphic to fully
relaxed state, Denver X-ray Conference, 2-6 August 2010, Denver, CO, USA
40
A.Ulyanenkov,
A.Benediktovitch, A.Zhilik, T.Ulyanenkova, I.Feranchuk, Calculation of X-ray
stress factors on the basis of SO(3) vector parameterization, Denver X-ray
Conference, 2-6 August 2010, Denver, CO, USA
41
A.Benediktovich,
I.Feranchuk, A.Ulyanenkov, Calculation of X-ray stress factors using vector
parameterization and irreducible representations for SO(3) group, 8th
European Conference on Residual Stress, 26-28 June 2010, Riva del Garda, Italy
42
A.Ulyanenkov,
I. Feranchuk, V.Uglov, H.Guerault, Influence of surface roughness on evaluation
of stress gradients in coatings, 8th European Conference on Residual
Stress, 26-28 June 2010, Riva del Garda,
Italy
43
A.Ulyanenkov,
M.Myronov, A.Dobbie, D.R.Leadley, H.Guerault, A.Benediktovitch, A.Zhilik,
T.Ulyanenkova, K.Shcherbachev, High-Resolution X-ray Reciprocal Space Mapping
of High Ge Content Graded SiGe Buffers Grown on Non-Standard Orientation Si
Substrates, The 16th International Conference on Crystal Growth, 8-13
August 2010, Beijing, China
44
R.
Arnhold, A. Herold, A.Ulyanenkov, D2 CRYSO Orientation Mapping on Single
Crystals, The 16th International Conference on Crystal Growth, 8-13
August 2010, Beijing, China
45
A.Ulyanenkov,
F.Rinaldi, S.Menzel, A.Zhilik, A.Benediktovitch, K.Saito, Consistent Evaluation
of the Crystallographic Miscut, Concentration and Relaxation Degree in
InGaAs/GaAs Structures by High-Resolution Reciprocal Space Mapping, The 16th
International Conference on Crystal
Growth, 8-13 August 2010, Beijing, China
46
A.Ulyanenkov,
J.Chrost, P.Siffalovic, L.Chitu, E.Majkova, K. Erlacher, G.Maier, M. Cornejo,
B.Ziberi and F. Frost, GISAXS and AFM study of self-assembled FeO and Si
nanoparticles, 10th Conference on High-Resolution X-ray Diffraction and
Imaging, 20-23 September 2010, Warwick, UK
47
I.D.Feranchuk,
F.Rinaldi, S.Menzel, M.Myronov, A.Dobbie, D.R.Leadley, A.Zhilik, K.Saito, and
A. Ulyanenkov, High-resolution reciprocal space mapping of multilayers with
concentration and relaxation gradients, 10th Conference on
High-Resolution X-ray Diffraction and Imaging, 20-23 September 2010, Warwick, UK
48
F.Rinaldi,
S.Menzel, I.D.Feranchuk, A.Zhilik, K. Saito, T.Ulyanenkova and A. Ulyanenkov, HRXRD
analysis of MBE grown complex superlattices, 10th Conference on
High-Resolution X-ray Diffraction and Imaging, 20-23 September 2010, Warwick, UK
49
A.Zhilik,
M.Myronov, A.Dobbie, D.R.Leadley, H.Guerault, T.Ulyanenkova, A.Benediktovitch,
A.Ulyanenkov, Reciprocal space mapping of graded SiGe buffers grown on
non-standard orientation Si substrates, 10th Conference on
High-Resolution X-ray Diffraction and Imaging, 20-23 September 2010, Warwick, UK
50
A.Benediktovich,
F.Rinaldi, S.Menzel, K.Saito, T.Ulyanenkova, I.Feranchuk, A.Ulyanenkov, Lattice
tilt, concentration and relaxation degree of partly relaxed InGaAs/GaAs
structures, 10th Conference on High-Resolution X-ray Diffraction and
Imaging, 20-23 September 2010, Warwick, UK
51
A.Ulyanenkov
and P.Schoderboeck, Stress gradient in molybdenum coatings, Herbstsitzung des
Fachausschusses Eigenspannungen, 26-27 Oktober, 2010, BESSY, Berlin, Germany
52
A.Benediktovitch,
I.Feranchuk and A.Ulyanenkov, Dynamical theory of X-ray diffraction from the
partially relaxed layers, E-MRS 2009 Spring Meeting, Strasbourg, France
53
A.Benediktovitch,
I.Feranchuk and A.Ulyanenkov, Dynamical X-ray scattering from the relaxed
structures, International Conference on Neutron and X-ray Scattering, 29 June –
3 July 2009, Kuala-Lumpur, Malaysia
54
A.Ulyanenkov,
A.Benediktovitch, I.Feranchuk, B.He and H.Ress, High-resolution X-ray
diffraction data analysis from the partly relaxed semiconductor structures,
Denver X-ray Conference, 27-31 July 2009, Colorado Springs, CO, USA
55
A.Ulyanenkov,
K.Erlacher, H.Guerault, A.Fuss, P.Siffalovic, L.Chitu, E.Majkova, G.Maier X-ray
and AFM study of self-assembled FeO nanoparticles, XIV International Conference
on Small-Angle Scattering 13- 18 September,
2009, Oxford, UK
56
A.Uyanenkov,
A.Lazar, H.Guérault, Combined
residual stress and texture evaluation in TixCr1-xN
coatings, 5th
International Conference on Mechanical Stress Evaluation by Neutrons and
Synchrotron Radiation, 10-12 November 2009, Mito, Japan
57
T.A.Ulyanenkova,
A.I.Benediktovich, I.Feranchuk, T.Baumbach, A.Ulyanenkov, Long-range scans and
many-beam effects for high-resolution x-ray diffraction from multilayered structures,
57th Denver X-ray Conference: p. 80, 4-8 August 2008, Denver, USA.
58
A.Ulyanenkov,
V.V.Uglov, T.A.Ulyanenkova, A.Lazar, H.Guérault, V.M.Anishchik,
S.V.Zlotski, T.Baumbach, Stress gradients in TixCr1-xN
coatings, 57th Denver X-ray Conference: p. 117, 4-8 August 2008, Denver, USA
59
I.
D. Feranchuk, T. Ulyanenkova, A. I. Benediktovich, A. Ulyanenkov, T.Baumbach, Many-beam
effects in wide-angle dynamical Xray diffraction from multilayers, XTOP
Conference, p.145, 15-19 September 2008, Linz, Austria
60
A.
Ulyanenkov, V. V. Uglov, T. Ulyanenkova, A. Lazar, H. Guérault, V.M. Anishchik,
S. V. Zlotski, T. Baumbach, Strain and stress gradients in thin film coatings,
XTOP Conference, p. 55, 15-19 September 2008, Linz, Austria
61
A.Ulyanenkov,
V.V.Uglov, V.M.Anishchik, S.V.Zlotski, J.Brechbühl, A.Lazar, T.A.Alexeeva,
Stress and composition evaluation for gradient nitride coatings, 56th Denver
X-ray Conference: p. 35, 30 July - 3 August 2007, Colorado Springs, USA
62
A.Ulyanenkov,
Universal software for residual stress evaluation from 1D and 2D x-ray
diffraction data, 56th Denver X-ray Conference: p. 46, 30 July - 3 August 2007,
Colorado Springs, USA.
63
V.V.Uglov,
V.M.Anishchik, S.V.Zlotski, I.D.Feranchuk, T.A.Alexeeva, A.Ulyanenkov, J.Brechbuehl, A.P.Lazar, Evolution of composition and
hardness of gradient nitride coatings E-MRS, p.87, May 28 - June 1, 2007, Strasbourg, France
64
A.
Ulyanenkov, I.Feranchuk, S.Feranchuk, T.Alexeeva, Novel approach to calculation
of X-ray reflection from rough surfaces, Workshop on X-ray micro and nanoprobes: instruments, methodologies and applications,
11-17 June 2007, Erice, Italy
65
А.Ульяненков, Новые методы интерпретации
данных в рентгеновской дифракции высокого разрешения, рефлектометрии и
малоугловом рассеянии, VI национальная конференция по применению
рентгеновского, синхротронного излучений, нейтронов и электронов для исследования
материалов, 12-17 ноября, 2007, Москва, Russia
66
A.
Ulyanenkov, M. Myronov, Y. Shiraki, K. Saito, Investigation of strain,
relaxation degree, interface roughness and porosity of SiGe/Si MODFET
heterostructures (invited), 55th Denver X-ray Conference: p. 31, 7-11 August 2006, Denver,
CO, USA.
67
A.
Ulyanenkov, M. Myronov, Y. Shiraki, K. Saito, Investigation of strain,
relaxation degree, interface roughness and porosity of SiGe/Si MOSFET
structures, European Materials Research Society Meeting: p. 233, May 29-June 2,
2006, Nice, France.
68
A.
Ulyanenkov, M. Myronov, Y. Shiraki, K. Saito, Investigation of strain,
relaxation degree, contamination, interface roughness and dislocation density
of SiGe/Si MODFET heterostructures, 8th Biennial Conference on High Resolution
X-Ray Diffraction and Imaging: p. 21, 19-22 September 2006, Baden-Baden, Germany.
69
D.
Agnihotri, V.E. Asadchikov, E. Bontempi, C-H. Chang, P. Colombi, L. E. Depero,
M. Farnworth, T. Fujimoto, A. Gibaud, M.
Jergel, D. Keith Bowen, M. Krumrey, A. Lamperti, T. Lafford, R. J. Matyi, T.
Ma, M. Meduna, S. Milita, K. Sakurai, L. Shabel'nikov, A. Ulyanenkov, A. van
der Lee, C. Wiemer, X-Ray Reflectivity measurements to evaluate thin films and
multilayers thickness: preliminary results of the first world Round-Robin Test,
8th Biennial Conference on High Resolution X-Ray Diffraction and Imaging: p. 76,
18-22 September 2006, Baden-Baden, Germany.
70
A.
Ulyanenkov, Novel methods and universal software for HRXRD, XRR and GISAXS data
interpretation (invited), European
Materials Research Society Meeting: p. 84, Mai 31 - June 3, 2005, Strasbourg, France.
71
A.
Ulyanenkov, Novel analytical approaches in numerical analysis of XRR and HRXRD
data from thin films (invited), 54th
Denver X-ray Conference: p. 147, 1-5 August 2005, Colorado Springs, CO, USA.
72
I.D.
Feranchuk, A.S. Lobko, A. Ulyanenkov, Theoretical interpretation of the
experiments with high-resolution parametric X-rays, 54th Denver X-ray Conference:
p. 69, 1-5 August 2005, Colorado Springs, CO, USA.
73
I.D.
Feranchuk, S.I. Feranchuk, L. Komarov, S. Sytova, A. Ulyanenkov, Analytical
ansatz for self-consistent calculations of x-ray transmission and reflection
coefficients at graded interfaces, Conference on experimental and computing
methods in high resolution diffraction applied for structure characterization
of modern materials: p. 45, June 13-17, 2004, Zakopane, Poland.
74
A.
Ulyanenkov, R. Eisenhower, I. Feranchuk, H. Guerault, H. Ress, Ultra-fast
simultaneous fitting of several Bragg reflections from AlAs/GaAs superlattices
using method of eigenwaves, 53rd Denver X-ray Conference: p. 136, 2-6 August
2004, Steamboat Springs, CO, USA.
75
A.
Ulyanenkov, Analytical ansatz for self-consistent calculation of x-ray
transmission and reflection coefficients at graded interfaces, 8th International
Conference on Surface X-ray and Neutron Scattering: p. 155, June 28th - July
2nd 2004, Bad Honnef, Germany.
76
A.
Ulyanenkov, LEPTOS: Software for interpretation of X-ray reflectivity and X-ray
diffraction data from multilayers and superlattices (invited), 49th Annual Meeting SPIE: p. 173, 2 - 6 August 2004, Denver,
CO, USA.
77
A.
Ulyanenkov, I. Feranchuk, S. Feranchuk, A. Minkevich, Fast simulation of X-ray
reflectivity and diffraction from superlattices, 7th Biennial Conference on
High Resolution X-Ray Diffraction and Imaging: p. 16, 10-14 September 2004, Prague,
Czech Republic.
78
I.
Feranchuk, A. Ulyanenkov, Microscopic calculation of the X-ray susceptibility
for arbitrary wavelength, Gordon Research Conference on X-ray Physics, p. 68, July
13-18, 2003, Bristol, RI, USA.
79
A.
Ulyanenkov, I. Feranchuk, S. Feranchuk, Simulation of X-ray reflectivity from
periodical surface gratings, 51st Denver X-ray Conference: p. 48, 29th July -
2nd August 2002, Colorado Springs, CO, USA.
80
A.
Ulyanenkov, Analysis of the factors, influencing the precision of simulated X-ray
diffraction (reflection) curves (invited),
51st Denver X-ray Conference: p. 49, 29 July - 2 August, 2002, Colorado Springs,
CO, USA.
81
A.
Ulyanenkov, Diffuse X-ray scattering as a measure of nanoscale imperfections,
14th American Conference on Crystal Growth and Epitaxy: p. 109,
August 4 - 9, 2002, Seattle, WA, USA.
82
A.
Ulyanenkov, I. Feranchuk, S. Feranchuk, Exact Analytical Solution for X-ray
Reflectivity from Periodical Surface Gratings, 6th Biennial Conference on High
Resolution X-Ray Diffraction and Imaging: p. 134, 10-14 September 2002, Grenoble,
France.
83
A.
Ulyanenkov, I. Feranchuk, A. Minkevich, H. Ress, J. Grenzer, Diffuse X-ray
scattering from GaAs/AlAs superlattices: new theoretical approach for data
interpretation, 50th Denver X-ray Conference: p. 304, 30th July - 3rd
August 2001, Steamboat Springs, CO, USA.
84
A.
Ulyanenkov, I. Feranchuk, L.I. Komarov, Calculation of atomic scattering and Debye-Waller
factors: step toward accurate estimation for X-ray polarizability, 50th Denver
X-ray Conference: p. 55, 30th July - 3rd August 2001, Steamboat Springs, CO, USA.
85
A.
Ulyanenkov, I. Feranchuk, A. Minkevich, H. Ress, J. Grenzer, Surfaces and
interfaces in Nanostructures, 16th International Conference on X-ray Optics and
Microanalysis: p. 32, July 2nd-6th, 2001, Vienna, Austria.
86
A.
Ulyanenkov, Coherent x-ray radiation, Gordon X-ray Conference on X-ray Physics:
p. 78, July 22-27, 2001, Connecticut College, New London, USA.
87
K.
Omote, A. Ulyanenkov, R. Matsuo, K. Shimizu, N. Ishino, M. Nishii, O. Yoda,
Evaluation of the interface morphology of Mo/Si and W/Si multilayers by X-ray
specular reflectivity and diffuse scattering, 5th International Conference on
the Physics of X-Ray Multilayer Structures, p. 57, March 5-9, 2000, Chamonix
Mont-Blanc, France.
88
I.D.
Feranchuk, A. Ulyanenkov, J. Harada, Interference of Parametric X-ray and
Coherent Bremsstrahlung radiation from nonrelativistic electrons, Application
to the phase analysis: p. 16, 49th Denver X-ray Conference, July 31
- August 4, 2000, Denver, CO, USA.
89
A.
Ulyanenkov, K. Inaba, K. Omote, J. Harada, M. Ishino, O. Yoda, X-Ray study of
Mo/Si multilayers grown on glass substrates, 49th Denver X-ray Conference: p.
225, July 31 - August 4, 2000, Denver, CO, USA.
90
A.
Ulyanenkov, X-Ray diffraction analysis of free-standing and buried quantum
wires (invited), 49th Denver X-ray
Conference: p. 227, July 31 – August 4, 2000, Denver, CO, USA.
91
A.
Ulyanenkov, U. Pietsch, K. Omote, N. Darowski, J. Grenzer, K. Inaba, A. Forchel,
X-Ray diffraction and reflectivity analysis of free-standing quantum wires, 5th
Biennial Conference on High Resolution X-Ray Diffraction and Imaging: p. 32,
13-15 September 2000, Zakopane, Poland.
92
A.
Ulyanenkov, I.D. Feranchuk, J. Harada, Phase determination method based on the
interference of parametric x-ray and coherent bremsstrahlung radiation, 5th
Biennial Conference on High Resolution X-Ray Diffraction and Imaging: p. 103, 13-15
September 2000, Zakopane, Poland.
93
A.
Ulyanenkov, K. Inaba, K. Omote, J. Harada, M. Ishino, O. Yoda, X-ray study of
Mo/Si multilayers grown on thermally stable substrates, 5th Biennial Conference
on High Resolution X-Ray Diffraction and Imaging: p. 104, 13-15 September 2000,
Zakopane, Poland.
94
I.D.
Feranchuk, A. Ulyanenkov, Application of X-ray radiation from nonrelativistic
electrons to thin films and multilayer analysis, 5th Biennial Conference on
High Resolution X-Ray Diffraction and Imaging: p. 139, 13-15 September 2000, Zakopane,
Poland.
95
A.
Ulyanenkov, R. Matsuo, K. Omote, J. Harada, M. Ishino, M. Nishii, O. Yoda,
Evaluation of the interface morphology in Mo/Si superlattices by X-ray specular
and diffuse scattering, 48th Denver X-ray Conference: p. 128, 2 August – 6
August 1999, Steamboat Springs, CO, USA.
96
A.
Ulyanenkov, J. Harada, Application of Genetic Algorithm to the refinement of
structure parameters from X-ray reflectivity data. Superlattices and Thin Solid
Films, 48th Denver X-ray Conference: p. 109, 2 August – 6 August 1999, Steamboat
Springs, CO, USA.
97
A.
Ulyanenkov, R. Matsuo, K. Omote, K. Inaba, J. Harada, M. Ishino, M. Nishii, O.
Yoda, Investigation of the interface morphology in Mo/Si superlattices by X-ray
specular and diffuse scattering, 6th International Conference on Surface X-ray
and Neutron Scattering: p. 47, 12-17 September 1999, Noordwijkerhout, The Netherlands.
98
A.
Ulyanenkov, J. Harada, The Genetic Algorithm: Refinement of x-ray reflectivity
data from multilayers and thin films, 6th International Conference on Surface
X-ray and Neutron Scattering: p. 95, 12-17 September 1999, Noordwijkerhout, The Netherlands.
99
I.D.
Feranchuk, A. Ulyanenkov, J. Harada, Parametric X-ray radiation from
nonrelativistic particles: theory and application for structure analysis, 6th
International Conference on Surface X-ray and Neutron Scattering: p. 147, 12-17
September 1999, Noordwijkerhout, The
Netherlands.
100
U.
Pietsch, A. Ulyanenkov, N. Darowski, J. Grenzer, K.H. Wang, A. Forchel,
Evaluation of strain distribution in freestanding and buried lateral
nanostructures, 6th International Conference on Surface X-ray and Neutron
Scattering: p. 158, 12-17 September 1999, Noordwijkerhout, The Netherlands.
101
A.
Ulyanenkov, X-ray diffuse scattering from Mo/Si x-ray mirrors, 4th
International School on X-ray Scattering: p. 97, 22-25 September 1999, Smolenice,
Slovakia.
102
A.Ulyanenkov,
N.Darowski, U.Pietsch, T.Baumbach, K.H.Wang, A.Forchel, Grazing-incidence x-ray
diffraction from semiconductor quantum wires, 4th Conference X-ray Topography
and High Resolution Diffraction: 9-11 September 1998, Durham, UK.
103
I.D.
Feranchuk, A. Ulyanenkov, N. Osaka, K. Omote, J. Harada, Parametric x-ray
radiation in x-ray tubes, Theoretical consideration: p. 186, 47th Denver X-ray
Conference, 1-5 August 1998, Colorado Springs, CO, USA.
104
A.
Ulyanenkov, R. Matsuo, K. Omote, J. Harada, S.-Y. Matsuno, X-ray reflectivity
and diffuse scattering from thin SiO2 film on Si substrate, 47th Denver
X-ray Conference: p. 199, 1-5 August 1998, Colorado Springs, CO, USA.
105
A.
Ulyanenkov, N. Darowski, U. Pietsch, T. Baumbach, K.H. Wang, A. Forchel, Grazing-incidence
X-ray diffraction from semiconductor quantum wires, 47th Denver X-ray
Conference: p. 202, 1-5 August, 1998, Colorado Springs, CO, USA.
106
A.Ulyanenkov,
N.Darowski, U.Pietsch, T.Baumbach, K.H.Wang, A.Forchel, Grazing-incidence X-ray
diffraction from semiconductor quantum wires, 18th European Crystallographic
Meeting: p. 37, 16th - 20th August 1998, Prague, Czech Republic.
107
A.
Ulyanenkov, A. Takase, M. Kuribayashi, K. Ishida, K. Kimura, L.-H. Kuo, T.
Yasuda, S. Miwa, T. Yao, H. Tomita, S. Komiya, Structural characterization of
ZnSe/GaAs interface by x-ray reflection, 18th European Crystallographic
Meeting: p. 218, 16-20 August 1998, Prague, Czech
Republic.
108
A.
Ulyanenkov, Accounting for the diffuse component in the grazing-incidence x-ray
diffraction from multilayers, 46th Denver X-ray Conference, p. 183, 3-8 August
1997, Denver, CO, USA.
109
A.
Ulyanenkov, U. Klemradt, U. Pietsch, Investigation of roughness correlations in
partially relaxed GaInAs/GaAs superlattices by X-ray diffuse scattering, 5th
International Conference on Surface X-Ray and Neutron Scattering: p. A8, 12-16
July 1997, Oxford, UK.
110
A.
Ulyanenkov, U. Klemradt, U. Pietsch, Probing of strain relaxation in
GaInAs/GaAs superlattices by X-ray diffuse scattering, Highlights in x-ray
synchrotron radiation research: p. 50, 17-20 November 1997, ESRF, Grenoble, France.
111
A.P.
Ulyanenkov, S.A. Stepanov, U. Pietsch, R. Kohler, Investigation of lateral
lattice misfits in multilayers by grazing-incidence X-ray diffraction, 23rd
Course "X-ray and Neutron Dynamical diffraction: Theory and Applications":
9-23 April, 1996, NATO Advanced Study
Institute: Poster Abstracts II, p. 15, Erice, Italy.
112
A.P.
Ulyanenkov, S.A. Stepanov, U. Pietsch, R. Kohler, Effect of lateral lattice
misfits in multilayers under grazing-incidence X-ray diffraction, 3rd
Conference X-ray Topography and High Resolution Diffraction: p. 175, 22-24
April 1996, Palermo, Italy.
113
С.А. Степанов, А.Я. Силенко, А.П.
Ульяненков, И.Я. Дубовская, Многоволновое параметрическое излучение частиц
в кристалле, XXVI конференция по взаимодействию заряженных частиц с
кристаллами: c. 56, 17-22 мая 1996, МГУ, Москва, Россия.
114
И.Я. Дубовская, С.А. Степанов,
А.П. Ульяненков, Многоволновые эффекты в ПРИ при низких энергиях, 5-й
российско-японский симпозиум по взаимодействию быстрых заряженных частиц с
твердым телом: 4-8 мая 1996, c. 30-31, Белгород, Россия.
115
S.A.
Stepanov, A.P. Ulyanenkov, An advanced method for computation of X-ray multiple
Bragg diffraction, 2nd European Symposium on X-ray Topography and High
Resolution Diffraction: 10-15 September 1994, p. 184, Berlin, Germany.
116
A.P.
Ulyanenkov, S.A. Stepanov,
Accounting for correlated roughness in X-ray grazing-incidence diffraction, 2nd
European Symposium on X-ray Topography and High Resolution Diffraction: 10-15
September 1994, p. 194, Berlin, Germany
117
И.В. Ничипор, А.П. Ульяненков,
И.Д. Феранчук, Программа для описания электромагнитных процессов при
плоскостном и осевом каналировании, XX конференция по взаимодействию заряженных
частиц с кристаллами: 10-15 мая 1992, МГУ, c. 95, Москва, СССР.
118
И.В. Ничипор, А.П. Ульяненков,
И.Д. Феранчук, Операторный метод расчета спектров излучения в случае осевого
каналирования заряженных частиц, XX конференция по взаимодействию заряженных
частиц с кристаллами: 13-18 мая 1990, МГУ, c. 86, Москва, СССР.
119
И.В. Ничипор, А.П. Ульяненков,
И.Д. Феранчук, Программный комплекс для расчета спектров излучения в случае
плоскостного каналирования заряженных частиц, XIX конференция по взаимодействию
заряженных частиц с кристаллами: 11-15 мая 1989, МГУ, c.93, Москва, СССР.
120
И.В. Ничипор, А.П. Ульяненков,
И.Д. Феранчук, Алгебраический метод для расчета квазиэнергий двух- и
трехуровневых систем, Теория атомов и атомных спектров: 29 мая - 2 июня 1988, c. 111, Тбилиси,
СССР.